Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥ìm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.
- Carbon based materials
- Rutherford backscattering
- Surface analysis
Likonen, J., Coad, J. P., Vainonen-Ahlgren, E., Renvall, T., Hole, D. E., Rubel, M., & Widdowson, A. (2007). Structural studies of deposited layers on JET MkII-SRP inner divertor tiles. Journal of Nuclear Materials, 363-365, 190-195. https://doi.org/10.1016/j.jnucmat.2007.01.007