Structural studies of deposited layers on JET MkII-SRP inner divertor tiles

Jari Likonen; J.P. Coad; Elizaveta Vainonen-Ahlgren; Tommi Renvall; D.E. Hole; M. Rubel; A. Widdowson

doi:10.1016/j.jnucmat.2007.01.007

Structural studies of deposited layers on JET MkII-SRP inner divertor tiles

Jari Likonen (Corresponding Author), J.P. Coad, Elizaveta Vainonen-Ahlgren, Tommi Renvall, D.E. Hole, M. Rubel, A. Widdowson

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Abstract

Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥ìm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.

Original language	English
Pages (from-to)	190-195
Journal	Journal of Nuclear Materials
Volume	363-365
DOIs	https://doi.org/10.1016/j.jnucmat.2007.01.007
Publication status	Published - 2007
MoE publication type	A1 Journal article-refereed

Keywords

Beryllium
Carbon based materials
Divertor
Rutherford backscattering
Surface analysis

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10.1016/j.jnucmat.2007.01.007

Cite this

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title = "Structural studies of deposited layers on JET MkII-SRP inner divertor tiles",

abstract = "Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥{\`i}m. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.",

keywords = "Beryllium, Carbon based materials, Divertor, Rutherford backscattering, Surface analysis",

author = "Jari Likonen and J.P. Coad and Elizaveta Vainonen-Ahlgren and Tommi Renvall and D.E. Hole and M. Rubel and A. Widdowson",

year = "2007",

doi = "10.1016/j.jnucmat.2007.01.007",

language = "English",

volume = "363-365",

pages = "190--195",

journal = "Journal of Nuclear Materials",

issn = "0022-3115",

publisher = "Elsevier",

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TY - JOUR

T1 - Structural studies of deposited layers on JET MkII-SRP inner divertor tiles

AU - Likonen, Jari

AU - Coad, J.P.

AU - Vainonen-Ahlgren, Elizaveta

AU - Renvall, Tommi

AU - Hole, D.E.

AU - Rubel, M.

AU - Widdowson, A.

PY - 2007

Y1 - 2007

N2 - Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥ìm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.

AB - Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥ìm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.

KW - Beryllium

KW - Carbon based materials

KW - Divertor

KW - Rutherford backscattering

KW - Surface analysis

U2 - 10.1016/j.jnucmat.2007.01.007

DO - 10.1016/j.jnucmat.2007.01.007

M3 - Article

SN - 0022-3115

VL - 363-365

SP - 190

EP - 195

JO - Journal of Nuclear Materials

JF - Journal of Nuclear Materials

ER -

Structural studies of deposited layers on JET MkII-SRP inner divertor tiles

Abstract

Keywords

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