Deposited layers formed on JET inner divertor tiles during 1998-2004 and 2001-2004 campaigns have been investigated using secondary ion mass spectrometry (SIMS), Rutherford Backscattering (RBS) and optical microscopy. The thickness of the deposit decreases from the top of vertical tile 1 to the bottom and then increases on vertical tile 3 reaching ¡60 ¥ìm. There are even thicker deposits on the small sloping section of the floor tile 4 that can be accessed by the plasma at the inner divertor legs. Deposited films on divertor inner wall tiles are enriched in Be indicating chemical erosion of C and a multi-step transport of C to the shadowed area on floor tile 4. The films have generally a layered and globular structure in the areas with plasma contact.
|Journal||Journal of Nuclear Materials|
|Publication status||Published - 2007|
|MoE publication type||A1 Journal article-refereed|
- Carbon based materials
- Rutherford backscattering
- Surface analysis