Surface characterization of cellulosic materials with XPS

Leena-Sisko Johansson, J. Campbell, Per Stenius, Jaakko Pere, Johanna Buchert

Research output: Contribution to conferenceConference AbstractScientificpeer-review

Original languageEnglish
Publication statusPublished - 2001
MoE publication typeNot Eligible
Event221st ACS National Meeting - San Diego, United States
Duration: 1 Apr 20015 Apr 2001

Conference

Conference221st ACS National Meeting
CountryUnited States
CitySan Diego
Period1/04/015/04/01

Cite this

Johansson, L-S., Campbell, J., Stenius, P., Pere, J., & Buchert, J. (2001). Surface characterization of cellulosic materials with XPS. Abstract from 221st ACS National Meeting, San Diego, United States.
Johansson, Leena-Sisko ; Campbell, J. ; Stenius, Per ; Pere, Jaakko ; Buchert, Johanna. / Surface characterization of cellulosic materials with XPS. Abstract from 221st ACS National Meeting, San Diego, United States.
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title = "Surface characterization of cellulosic materials with XPS",
author = "Leena-Sisko Johansson and J. Campbell and Per Stenius and Jaakko Pere and Johanna Buchert",
year = "2001",
language = "English",
note = "221st ACS National Meeting ; Conference date: 01-04-2001 Through 05-04-2001",

}

Johansson, L-S, Campbell, J, Stenius, P, Pere, J & Buchert, J 2001, 'Surface characterization of cellulosic materials with XPS' 221st ACS National Meeting, San Diego, United States, 1/04/01 - 5/04/01, .

Surface characterization of cellulosic materials with XPS. / Johansson, Leena-Sisko; Campbell, J.; Stenius, Per; Pere, Jaakko; Buchert, Johanna.

2001. Abstract from 221st ACS National Meeting, San Diego, United States.

Research output: Contribution to conferenceConference AbstractScientificpeer-review

TY - CONF

T1 - Surface characterization of cellulosic materials with XPS

AU - Johansson, Leena-Sisko

AU - Campbell, J.

AU - Stenius, Per

AU - Pere, Jaakko

AU - Buchert, Johanna

PY - 2001

Y1 - 2001

M3 - Conference Abstract

ER -

Johansson L-S, Campbell J, Stenius P, Pere J, Buchert J. Surface characterization of cellulosic materials with XPS. 2001. Abstract from 221st ACS National Meeting, San Diego, United States.