A new device concept for measuring the time‐resolved frequency chirp in modulated laser diodes is presented. It makes use of a solid silicon‐wafer etalon as an optical frequency discriminator. The transmission properties of the etalon are tuned by controlling the refractive index of silicon by tuning the temperature of the etalon. The device allows automated measurements of frequency chirps up to ±25 GHz in optical telecommunication links with a time resolution of about 20 ps.
|Journal||Microwave and Optical Technology Letters|
|Publication status||Published - 1999|
|MoE publication type||A1 Journal article-refereed|
- frequency chirp
- Fabry-Perot etalon
- modulated laser diodes
Niemi, T., Tammela, S., Kajava, T., Kaivola, M., & Ludvigsen, H. (1999). Temperature-tunable silicon-wafer etalon for frequency chirp measurements. Microwave and Optical Technology Letters, 20(3), 190-192. https://doi.org/10.1002/(SICI)1098-2760(19990205)20:3<190::AID-MOP13>3.0.CO;2-N