Temperature-tunable silicon-wafer etalon for frequency chirp measurements

Tapio Niemi, Simo Tammela, Timo Kajava, Matti Kaivola, Hanne Ludvigsen

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

A new device concept for measuring the time‐resolved frequency chirp in modulated laser diodes is presented. It makes use of a solid silicon‐wafer etalon as an optical frequency discriminator. The transmission properties of the etalon are tuned by controlling the refractive index of silicon by tuning the temperature of the etalon. The device allows automated measurements of frequency chirps up to ±25 GHz in optical telecommunication links with a time resolution of about 20 ps.
Original languageEnglish
Pages (from-to)190-192
JournalMicrowave and Optical Technology Letters
Volume20
Issue number3
DOIs
Publication statusPublished - 1999
MoE publication typeA1 Journal article-refereed

Keywords

  • frequency chirp
  • Fabry-Perot etalon
  • modulated laser diodes

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