Keyphrases
Test Beam
100%
APV25
100%
Electric Field (E-field)
100%
Steady State
50%
Irradiation
50%
Density of States
50%
Charge Carriers
50%
Beamline
50%
Strip Detector
50%
Magnetic Czochralski Silicon
50%
Charge Collection Efficiency
50%
Reference Plane
50%
Prototype Components
50%
Space Charge
50%
Emission Rate
50%
High Resistivity
50%
Detrapping
50%
Charge Injection
50%
Readout chip
50%
AC Coupling
50%
Beam Test
50%
Trapped Charge
50%
Detector Readout
50%
Muon Beam
50%
Hamamatsu
50%
CMS Detector
50%
Injected Carriers
50%
Strip Width
50%
Field Stabilization
50%
Beam Telescope
50%
INIS
beams
100%
irradiation
100%
trapping
60%
readout systems
60%
pitches
40%
silicon
40%
sensors
40%
charges
40%
electric fields
40%
MeV range
40%
efficiency
20%
levels
20%
density
20%
balances
20%
width
20%
steady-state conditions
20%
length
20%
emission
20%
stabilization
20%
space charge
20%
injection
20%
carriers
20%
charge carriers
20%
cern
20%
telescopes
20%
charge collection
20%
gev range
20%
muon beams
20%
cms detector
20%
Engineering
Electric Field
100%
Test Beam
100%
Collection Efficiency
50%
Deep Level
50%
Charge Injection
50%
Reference Plane
50%
Space Charge
50%
Charge Carrier
50%
Material Science
Silicon
100%
Electrical Resistivity
50%
Density
50%
Charge Carrier
50%