Test beam results of heavily irradiated magnetic Czochralski silicon (MCz-Si) strip detectors

P. Luukka*, J. Härkünen, T. Mäenpää, B. Betchart, S. Bhattacharya, S. Czellar, R. Demina, A. Dierlamm, Y. Gotra, M. Frey, F. Hartmann, V. Karimäki, T. Keutgen, S. Korjenevski, M. J. Kortelainen, T. Lampén, V. Lemaitre, M. Maksimow, O. Militaru, H. MoilanenM. Neuland, H. J. Simonis, L. Spiegel, Eija Tuominen, J. Tuominiemi, E. Tuovinen, H. Viljanen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)

Abstract

Strip detectors with an area of 16 cm2 were processed on high resistivity n-type magnetic Czochralski silicon. In addition, detectors were processed on high resistivity Float Zone wafers with the same mask set for comparison. The detectors were irradiated to several different fluences up to the fluence of 3 × 1015 1 MeV neq / cm2 with protons or with mixed protons and neutrons. The detectors were fully characterized with CV- and IV-measurements prior to and after the irradiation. The beam test was carried out at the CERN H2 beam line using a silicon beam telescope that determines the tracks of the incoming particles and hence provides a reference measurement for the detector characterization. The n-type MCz-Si strip detectors have an acceptable S/N at least up to the fluence of 1 × 1015 neq / cm2 and thus, they are a feasible option for the strip detector layers in the SLHC tracking systems.

Original languageEnglish
Pages (from-to)497-500
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume612
Issue number3
DOIs
Publication statusPublished - 11 Jan 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • Beam test
  • Magnetic Czochralski silicon
  • Radiation hardness

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