Testing incompatibility of quantum devices with few states

Teiko Heinosaari (Corresponding Author), Takayuki Miyadera, Ryo Takakura

Research output: Contribution to journalArticleScientificpeer-review

Abstract

When observations must come from incompatible devices and cannot be produced by compatible devices is a property that motivates two integer-valued quantifications of incompatibility, called incompatibility dimension and compatibility dimension. The first one quantifies how many states are minimally needed to detect incompatibility if the test states are chosen carefully, whereas the second one quantifies how many states one may have to use if they are randomly chosen. With concrete examples we show that these quantities have unexpected behavior with respect to noise.

Original languageEnglish
Article number032228
Number of pages18
JournalPhysical Review A
Volume104
Issue number3
DOIs
Publication statusPublished - Sep 2021
MoE publication typeA1 Journal article-refereed

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