Testing the new generation of low-frequency current comparators

Alexandre Satrapinski, M. Götz, E. Pesel, N. Fletcher, P. Gournay, B. Rolland

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

Improved magnetic materials open the perspective of operating room-temperature current comparators at lower frequency without compromising metrological accuracy. Two prototypes of low-frequency current comparator (LFCCs) have been successfully tested in precision resistance ratio measurements at drive frequencies of 0.5 Hz and 1 Hz using the BIPM's bridge setup with a recently realized frequency extension. These measurements have been performed using standard resistors of 10 kΩ, 1 kΩ and 100 Ω nominal values as well as the quantized Hall resistance (QHR) of GaAs and graphene devices.
Original languageEnglish
Title of host publicationPrecision Electromagnetic Measurements (CPEM 2016), 2016 Conference on
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages1-2
ISBN (Electronic)978-1-4673-9134-4, 978-1-4673-9132-0
ISBN (Print)978-1-4673-9135-1
DOIs
Publication statusPublished - 11 Aug 2016
MoE publication typeA4 Article in a conference publication
EventConference on Precision Electromagnetic Measurements, CPEM 2016 - Ottawa, Canada
Duration: 10 Jul 201615 Jul 2016

Publication series

Name
ISSN (Electronic)2160-0171

Conference

ConferenceConference on Precision Electromagnetic Measurements, CPEM 2016
Abbreviated titleCPEM 2016
CountryCanada
CityOttawa
Period10/07/1615/07/16

Fingerprint

low frequencies
Hall resistance
magnetic materials
operating temperature
resistors
graphene
prototypes
room temperature
approximation

Keywords

  • resistance measurement
  • CCC
  • current comparator
  • low frequency
  • measurement uncertainty
  • sensitivity

Cite this

Satrapinski, A., Götz, M., Pesel, E., Fletcher, N., Gournay, P., & Rolland, B. (2016). Testing the new generation of low-frequency current comparators. In Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on (pp. 1-2). [7540510] Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/CPEM.2016.7540594
Satrapinski, Alexandre ; Götz, M. ; Pesel, E. ; Fletcher, N. ; Gournay, P. ; Rolland, B. / Testing the new generation of low-frequency current comparators. Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. Institute of Electrical and Electronic Engineers IEEE, 2016. pp. 1-2
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Satrapinski, A, Götz, M, Pesel, E, Fletcher, N, Gournay, P & Rolland, B 2016, Testing the new generation of low-frequency current comparators. in Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on., 7540510, Institute of Electrical and Electronic Engineers IEEE, pp. 1-2, Conference on Precision Electromagnetic Measurements, CPEM 2016, Ottawa, Canada, 10/07/16. https://doi.org/10.1109/CPEM.2016.7540594

Testing the new generation of low-frequency current comparators. / Satrapinski, Alexandre; Götz, M.; Pesel, E.; Fletcher, N.; Gournay, P.; Rolland, B.

Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. Institute of Electrical and Electronic Engineers IEEE, 2016. p. 1-2 7540510.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Satrapinski A, Götz M, Pesel E, Fletcher N, Gournay P, Rolland B. Testing the new generation of low-frequency current comparators. In Precision Electromagnetic Measurements (CPEM 2016), 2016 Conference on. Institute of Electrical and Electronic Engineers IEEE. 2016. p. 1-2. 7540510 https://doi.org/10.1109/CPEM.2016.7540594