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The Cryo-Harness Technology for the Athena X-IFU Detection Chain

  • H. Geoffray*
  • , J. Adams
  • , H. Fossecave
  • , E. Cucchetti
  • , E. Bellouard
  • , P. Peille
  • , C. Daniel
  • , O. Maisonnave
  • , E. Guilhem
  • , A. Jolly
  • , I. Maussang
  • , B. Jackon
  • , S. Bandler
  • , B. Doriese
  • , M. Durkin
  • , J. van der Kuur
  • , B. J. van Leeuwen
  • , Mikko Kiviranta
  • , D. Prêle
  • , L. Ravera
  • Y. Parot
*Corresponding author for this work
    • CNES Centre National d'Etudes Spatiales
    • National Aeronautics and Space Administration (NASA)
    • Cap Gemini SE
    • Netherlands Institute for Space Research (SRON)
    • National Institute of Standards and Technology (NIST)
    • Paris Climate Agency (APC Paris)
    • Institut de Recherche en Astrophysique et Planétologie (IRAP)

    Research output: Contribution to journal › Article › Scientific › peer-review

    Abstract

    CNES (French Space Agency) is in charge of the development of the X-ray Integral Field Unit (X-IFU) instrument for Athena, the high resolution X-ray spectrometer of the ESA Athena X-ray Observatory. X-IFU will deliver spectra from 0.2 to 12 keV with a spectral resolution in the range of 2.5 eV up to 7 keV on a 5′′ pixels, with a field of view > 4′ equivalent diameter. The main sensor array detection chain is a key part of the instrument, being by far the main contributor to its performance. It involves major partners: NASA GFSC, NIST, SRON, VTT, APC, and IRAP. The cryo-harness interconnecting the Focal Plane Assembly cold interface to the Warm Front End Electronics is under CNES responsibility. The different technical solutions are the loom technology and the shielded twisted pair technology. Characterizations have been performed on breadboards to assess the crosstalk performances for each solution. The results of these analysis are a driver to perform the trade-off between the available cryo-harness technologies.

    Original languageEnglish
    Pages (from-to)177-183
    JournalJournal of Low Temperature Physics
    Volume215
    DOIs
    Publication statusPublished - 27 Apr 2024
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Cryogenic harness
    • TDM readout
    • X-ray TES readout

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