The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films

Minnamari Saloaro; Sayani Majumdar; Hannu Huhtinen; Petriina Paturi

doi:10.1051/epjconf/20134015012

The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films

Minnamari Saloaro, Sayani Majumdar, Hannu Huhtinen, Petriina Paturi

Not published at VTT

Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review

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Abstract

Magnetoresistive Sr2FeMoO6 thin ﬁlms were grown by pulsed laser deposition with three diﬀerent thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the ﬁlms were measured. Structural properties showed that impurity phases are formed when the ﬁlm thickness exceed limiting thickness over 300 nm. Otherwise no major diﬀerences were observed in structural and magnetic properties between the ﬁlms. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest ﬁlms. At 350 K the magnetoresistive (MR) behaviour was very similar for all the ﬁlms, but at 10 K the negative MR was clearly largest for the thickest ﬁlm and also the shape of the curve in low ﬁelds deviated from others.

Original language	English
Article number	15012
Pages (from-to)	4
Journal	EPJ Web of Conferences
Volume	40
DOIs	https://doi.org/10.1051/epjconf/20134015012
Publication status	Published - 2013
MoE publication type	A4 Article in a conference publication
Event	Joint European Magnetic Symposia, JEMS 2012 - Parma, Italy Duration: 9 Sep 2012 → 14 Sep 2012

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title = "The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films",

abstract = "Magnetoresistive Sr2FeMoO6 thin ﬁlms were grown by pulsed laser deposition with three diﬀerent thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the ﬁlms were measured. Structural properties showed that impurity phases are formed when the ﬁlm thickness exceed limiting thickness over 300 nm. Otherwise no major diﬀerences were observed in structural and magnetic properties between the ﬁlms. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest ﬁlms. At 350 K the magnetoresistive (MR) behaviour was very similar for all the ﬁlms, but at 10 K the negative MR was clearly largest for the thickest ﬁlm and also the shape of the curve in low ﬁelds deviated from others.",

author = "Minnamari Saloaro and Sayani Majumdar and Hannu Huhtinen and Petriina Paturi",

year = "2013",

doi = "10.1051/epjconf/20134015012",

language = "English",

volume = "40",

pages = "4",

journal = "EPJ Web of Conferences",

issn = "2101-6275",

publisher = "EDP Sciences",

note = "Joint European Magnetic Symposia, JEMS 2012, JEMS 2012 ; Conference date: 09-09-2012 Through 14-09-2012",

}

TY - JOUR

T1 - The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films

AU - Saloaro, Minnamari

AU - Majumdar, Sayani

AU - Huhtinen, Hannu

AU - Paturi, Petriina

PY - 2013

Y1 - 2013

N2 - Magnetoresistive Sr2FeMoO6 thin ﬁlms were grown by pulsed laser deposition with three diﬀerent thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the ﬁlms were measured. Structural properties showed that impurity phases are formed when the ﬁlm thickness exceed limiting thickness over 300 nm. Otherwise no major diﬀerences were observed in structural and magnetic properties between the ﬁlms. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest ﬁlms. At 350 K the magnetoresistive (MR) behaviour was very similar for all the ﬁlms, but at 10 K the negative MR was clearly largest for the thickest ﬁlm and also the shape of the curve in low ﬁelds deviated from others.

AB - Magnetoresistive Sr2FeMoO6 thin ﬁlms were grown by pulsed laser deposition with three diﬀerent thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the ﬁlms were measured. Structural properties showed that impurity phases are formed when the ﬁlm thickness exceed limiting thickness over 300 nm. Otherwise no major diﬀerences were observed in structural and magnetic properties between the ﬁlms. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest ﬁlms. At 350 K the magnetoresistive (MR) behaviour was very similar for all the ﬁlms, but at 10 K the negative MR was clearly largest for the thickest ﬁlm and also the shape of the curve in low ﬁelds deviated from others.

U2 - 10.1051/epjconf/20134015012

DO - 10.1051/epjconf/20134015012

M3 - Article in a proceedings journal

VL - 40

SP - 4

JO - EPJ Web of Conferences

JF - EPJ Web of Conferences

SN - 2101-6275

M1 - 15012

T2 - Joint European Magnetic Symposia, JEMS 2012

Y2 - 9 September 2012 through 14 September 2012

ER -