Magnetoresistive Sr2FeMoO6 thin ﬁlms were grown by pulsed laser deposition with three diﬀerent thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the ﬁlms were measured. Structural properties showed that impurity phases are formed when the ﬁlm thickness exceed limiting thickness over 300 nm. Otherwise no major diﬀerences were observed in structural and magnetic properties between the ﬁlms. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest ﬁlms. At 350 K the magnetoresistive (MR) behaviour was very similar for all the ﬁlms, but at 10 K the negative MR was clearly largest for the thickest ﬁlm and also the shape of the curve in low ﬁelds deviated from others.
|Journal||EPJ Web of Conferences|
|Publication status||Published - 2013|
|MoE publication type||A4 Article in a conference publication|
|Event||Joint European Magnetic Symposia, JEMS 2012 - Parma, Italy|
Duration: 9 Sep 2012 → 14 Sep 2012