The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films

Minnamari Saloaro, Sayani Majumdar, Hannu Huhtinen, Petriina Paturi

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

10 Citations (Scopus)

Abstract

Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.
Original languageEnglish
Article number15012
Pages (from-to)4
JournalEPJ Web of Conferences
Volume40
DOIs
Publication statusPublished - 2013
MoE publication typeA4 Article in a conference publication
EventJoint European Magnetic Symposia, JEMS 2012 - Parma, Italy
Duration: 9 Sep 201214 Sep 2012

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film thickness
transport properties
thin films
curves
pulsed laser deposition
magnetic properties
impurities

Cite this

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title = "The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films",
abstract = "Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.",
author = "Minnamari Saloaro and Sayani Majumdar and Hannu Huhtinen and Petriina Paturi",
year = "2013",
doi = "10.1051/epjconf/20134015012",
language = "English",
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The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films. / Saloaro, Minnamari; Majumdar, Sayani; Huhtinen, Hannu; Paturi, Petriina.

In: EPJ Web of Conferences, Vol. 40, 15012, 2013, p. 4.

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

TY - JOUR

T1 - The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films

AU - Saloaro, Minnamari

AU - Majumdar, Sayani

AU - Huhtinen, Hannu

AU - Paturi, Petriina

PY - 2013

Y1 - 2013

N2 - Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.

AB - Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.

U2 - 10.1051/epjconf/20134015012

DO - 10.1051/epjconf/20134015012

M3 - Article in a proceedings journal

VL - 40

SP - 4

JO - EPJ Web of Conferences

JF - EPJ Web of Conferences

SN - 2101-6275

M1 - 15012

ER -