Abstract
| Original language | English |
|---|---|
| Article number | 15012 |
| Pages (from-to) | 4 |
| Journal | EPJ Web of Conferences |
| Volume | 40 |
| DOIs | |
| Publication status | Published - 2013 |
| MoE publication type | A4 Article in a conference publication |
| Event | Joint European Magnetic Symposia, JEMS 2012 - Parma, Italy Duration: 9 Sep 2012 → 14 Sep 2012 |
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The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films. / Saloaro, Minnamari; Majumdar, Sayani; Huhtinen, Hannu; Paturi, Petriina.
In: EPJ Web of Conferences, Vol. 40, 15012, 2013, p. 4.Research output: Contribution to journal › Article in a proceedings journal › Scientific › peer-review
TY - JOUR
T1 - The effect of film thickness on the magnetic and magneto-transport properties of Sr2FeMoO6 thin films
AU - Saloaro, Minnamari
AU - Majumdar, Sayani
AU - Huhtinen, Hannu
AU - Paturi, Petriina
PY - 2013
Y1 - 2013
N2 - Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.
AB - Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others.
U2 - 10.1051/epjconf/20134015012
DO - 10.1051/epjconf/20134015012
M3 - Article in a proceedings journal
VL - 40
SP - 4
JO - EPJ Web of Conferences
JF - EPJ Web of Conferences
SN - 2101-6275
M1 - 15012
ER -