The impact of crosstalk in the X-IFU instrument on Athena science cases

R. den Hartog, P. Peille, T. Dauser, B. Jackson, S. Bandler, D. Barret, T. Brand, J-W. den Herder, M. Kiviranta, J. van der Kuur, S. Smith, J. Wilms

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

In this paper we present a first assessment of the impact of various forms of instrumental crosstalk on the science performance of the X-ray Integral Field Unit (X-IFU) on the Athena X-ray mission. This assessment is made using the SIXTE end-to-end simulator in the context of one of the more technically challenging science cases for the XIFU instrument. Crosstalk considerations may influence or drive various aspects of the design of the array of high-countrate Transition Edge Sensor (TES) detectors and its Frequency Domain Multiplexed (FDM) readout architecture.
Original languageEnglish
Title of host publicationSpace Telescopes and Instrumentation 2016
Subtitle of host publicationUltraviolet to Gamma Ray
PublisherInternational Society for Optics and Photonics SPIE
ISBN (Print)978-151-06018-7-1
DOIs
Publication statusPublished - 26 Jul 2016
MoE publication typeA4 Article in a conference publication
EventSPIE Astronomical Telescopes and Instrumentation - Edinburgh, United Kingdom
Duration: 26 Jun 20161 Jul 2016

Publication series

SeriesProceedings of SPIE
Volume9905
ISSN0277-786X

Conference

ConferenceSPIE Astronomical Telescopes and Instrumentation
CountryUnited Kingdom
CityEdinburgh
Period26/06/161/07/16

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Keywords

  • Athena
  • crosstalk
  • energy resolution
  • FDM
  • SIXTE
  • TES detectors
  • X-IFU

Cite this

den Hartog, R., Peille, P., Dauser, T., Jackson, B., Bandler, S., Barret, D., Brand, T., den Herder, J-W., Kiviranta, M., van der Kuur, J., Smith, S., & Wilms, J. (2016). The impact of crosstalk in the X-IFU instrument on Athena science cases. In Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray International Society for Optics and Photonics SPIE. Proceedings of SPIE, Vol.. 9905 https://doi.org/10.1117/12.2232098