The influence of edge effects on the detection properties of cadmium telluride

M. Bosma, M. van Beuzekom, Sami Vähänen, J. Visser, E. Koffeman

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)

Abstract

Driven by the demand of various applications for a detection area that is larger than the active area of a single detector module, we explore the possibility to realise a large-area detector by a seamless tessellation of multiple detectors. This requires sensors with a minimum amount of dead area at the edge. In order to be able to reduce this area, edge effects must be understood and avoided or mitigated. In this paper, we report on first tests that are performed on diamond-blade diced slim-edge pieces of cadmium telluride with a last-pixel-to-edge distance of only 65 µm. The results indicate that the edge-pixel response is not significantly affected with respect to the leakage current and the charge collection efficiency. First measurements towards a quantification of the detective quantum efficiency have been made on edge pixels by determining the pixel response function and the noise power spectrum
Original languageEnglish
Title of host publicationProceedings of the NSS/MIC 2011
Subtitle of host publicationIEEE Nuclear Science Symposium Conference Record
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages4812-4817
ISBN (Electronic)978-1-4673-0120-6
ISBN (Print)978-1-4673-0118-3
DOIs
Publication statusPublished - 2012
MoE publication typeNot Eligible
EventIEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011 - Valencia, Spain
Duration: 23 Oct 201129 Oct 2011

Conference

ConferenceIEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
Abbreviated titleNSS/MIC 2011
CountrySpain
CityValencia
Period23/10/1129/10/11

Fingerprint

cadmium tellurides
pixels
detectors
noise spectra
blades
power spectra
quantum efficiency
leakage
modules
diamonds
sensors

Keywords

  • Biomedical imaging
  • position sensitive particle detectors
  • sensors
  • X-ray detectors

Cite this

Bosma, M., van Beuzekom, M., Vähänen, S., Visser, J., & Koffeman, E. (2012). The influence of edge effects on the detection properties of cadmium telluride. In Proceedings of the NSS/MIC 2011 : IEEE Nuclear Science Symposium Conference Record (pp. 4812-4817). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/NSSMIC.2011.6154720
Bosma, M. ; van Beuzekom, M. ; Vähänen, Sami ; Visser, J. ; Koffeman, E. / The influence of edge effects on the detection properties of cadmium telluride. Proceedings of the NSS/MIC 2011 : IEEE Nuclear Science Symposium Conference Record. IEEE Institute of Electrical and Electronic Engineers , 2012. pp. 4812-4817
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Bosma, M, van Beuzekom, M, Vähänen, S, Visser, J & Koffeman, E 2012, The influence of edge effects on the detection properties of cadmium telluride. in Proceedings of the NSS/MIC 2011 : IEEE Nuclear Science Symposium Conference Record. IEEE Institute of Electrical and Electronic Engineers , pp. 4812-4817, IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011, Valencia, Spain, 23/10/11. https://doi.org/10.1109/NSSMIC.2011.6154720

The influence of edge effects on the detection properties of cadmium telluride. / Bosma, M.; van Beuzekom, M.; Vähänen, Sami; Visser, J.; Koffeman, E.

Proceedings of the NSS/MIC 2011 : IEEE Nuclear Science Symposium Conference Record. IEEE Institute of Electrical and Electronic Engineers , 2012. p. 4812-4817.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Bosma M, van Beuzekom M, Vähänen S, Visser J, Koffeman E. The influence of edge effects on the detection properties of cadmium telluride. In Proceedings of the NSS/MIC 2011 : IEEE Nuclear Science Symposium Conference Record. IEEE Institute of Electrical and Electronic Engineers . 2012. p. 4812-4817 https://doi.org/10.1109/NSSMIC.2011.6154720