Abstract
The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.
| Original language | English |
|---|---|
| Pages (from-to) | 175-180 |
| Journal | Ferroelectrics |
| Volume | 65 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1985 |
| MoE publication type | A1 Journal article-refereed |