The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry

Valentin Afanasjev, Seppo Korpela, Tuukka Tuomi

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.

Original languageEnglish
Pages (from-to)175 - 180
Number of pages6
JournalFerroelectrics
Volume65
Issue number1
DOIs
Publication statusPublished - 1985
MoE publication typeNot Eligible

Fingerprint

ferroelectric materials
Spectroscopic ellipsometry
Ferroelectric materials
ellipsometry
Refractive index
surface layers
refractivity
Electric space charge
space charge
oscillators
Polarization
Wavelength
polarization
wavelengths

Cite this

@article{87e660fe7a0641d990d3e93b33e8afdc,
title = "The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry",
abstract = "The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.",
author = "Valentin Afanasjev and Seppo Korpela and Tuukka Tuomi",
year = "1985",
doi = "10.1080/00150198508008896",
language = "English",
volume = "65",
pages = "175 -- 180",
journal = "Ferroelectrics",
issn = "0015-0193",
publisher = "Taylor & Francis",
number = "1",

}

The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry. / Afanasjev, Valentin; Korpela, Seppo; Tuomi, Tuukka.

In: Ferroelectrics, Vol. 65, No. 1, 1985, p. 175 - 180.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry

AU - Afanasjev, Valentin

AU - Korpela, Seppo

AU - Tuomi, Tuukka

PY - 1985

Y1 - 1985

N2 - The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.

AB - The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.

U2 - 10.1080/00150198508008896

DO - 10.1080/00150198508008896

M3 - Article

VL - 65

SP - 175

EP - 180

JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

IS - 1

ER -