The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry

Valentin Afanasjev, Seppo Korpela, Tuukka Tuomi

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

The ellipsometric measurements over the 350 to 700 nm wavelength range are carried out on a number of ferroelectric materials and the results are compared with those obtained by other authors. It is shown that the measured refractive index n spectra can be described by means of a one-oscillator model. The values of n at the opposite faces of the sample having a remnant polarization are different. Such a phenomenon may be connected with the different parameters of the space charge barrier at the opposite surfaces of the ferroelectric samples.

Original languageEnglish
Pages (from-to)175 - 180
Number of pages6
JournalFerroelectrics
Volume65
Issue number1
DOIs
Publication statusPublished - 1985
MoE publication typeNot Eligible

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