The redundancy of two three-state devices

Tapio Pulli

doi:10.1016/0026-2714(85)90482-2

The redundancy of two three-state devices

Tapio Pulli

VTT Technical Research Centre of Finland

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Abstract

The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

Original language	English
Pages (from-to)	1067 - 1073
Number of pages	7
Journal	Microelectronics Reliability
Volume	25
Issue number	6
DOIs	https://doi.org/10.1016/0026-2714(85)90482-2
Publication status	Published - 1985
MoE publication type	Not Eligible

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title = "The redundancy of two three-state devices",

abstract = "The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.",

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AB - The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

U2 - 10.1016/0026-2714(85)90482-2

DO - 10.1016/0026-2714(85)90482-2

M3 - Article

VL - 25

SP - 1067

EP - 1073

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

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