Abstract
The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.
| Original language | English |
|---|---|
| Pages (from-to) | 1067 - 1073 |
| Number of pages | 7 |
| Journal | Microelectronics Reliability |
| Volume | 25 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1985 |
| MoE publication type | Not Eligible |