The redundancy of two three-state devices

Tapio Pulli

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)

Abstract

The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

Original languageEnglish
Pages (from-to)1067 - 1073
Number of pages7
JournalMicroelectronics Reliability
Volume25
Issue number6
DOIs
Publication statusPublished - 1985
MoE publication typeNot Eligible

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Pulli, Tapio. / The redundancy of two three-state devices. In: Microelectronics Reliability. 1985 ; Vol. 25, No. 6. pp. 1067 - 1073.
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The redundancy of two three-state devices. / Pulli, Tapio.

In: Microelectronics Reliability, Vol. 25, No. 6, 1985, p. 1067 - 1073.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - The redundancy of two three-state devices

AU - Pulli, Tapio

PY - 1985

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N2 - The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

AB - The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

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DO - 10.1016/0026-2714(85)90482-2

M3 - Article

VL - 25

SP - 1067

EP - 1073

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

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