Abstract
The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.
| Original language | English |
|---|---|
| Pages (from-to) | 1067 - 1073 |
| Number of pages | 7 |
| Journal | Microelectronics Reliability |
| Volume | 25 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1985 |
| MoE publication type | Not Eligible |
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The redundancy of two three-state devices. / Pulli, Tapio.
In: Microelectronics Reliability, Vol. 25, No. 6, 1985, p. 1067 - 1073.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - The redundancy of two three-state devices
AU - Pulli, Tapio
PY - 1985
Y1 - 1985
N2 - The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.
AB - The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.
U2 - 10.1016/0026-2714(85)90482-2
DO - 10.1016/0026-2714(85)90482-2
M3 - Article
VL - 25
SP - 1067
EP - 1073
JO - Microelectronics Reliability
JF - Microelectronics Reliability
SN - 0026-2714
IS - 6
ER -