Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra

Matti Mõttus, Aarne Hovi, Miina Rautiainen

    Research output: Contribution to journalArticleScientificpeer-review

    7 Citations (Scopus)

    Abstract

    We present the theoretical background and analytical equations for calculating spectral reflectance and transmittance factors for plant leaves from data collected by a field spectroradiometer attached to a double-integrating sphere. The sphere constants required for the calculations are derived from measurements of an empty sample port and a diffuse reflectance panel. The new method is applied in measuring the spectra of leaves belonging to 13 tree species. The greatest advantages of a double-sphere system compared with the conventional single-sphere substitution method is the speed of measurements, ease of operation, and increased portability and field-ruggedness.
    Original languageEnglish
    Pages (from-to)563-571
    Number of pages9
    JournalApplied Optics
    Volume56
    Issue number3
    DOIs
    Publication statusPublished - 20 Jan 2017
    MoE publication typeA1 Journal article-refereed

    Fingerprint

    leaves
    transmittance
    reflectance
    ruggedness
    spectroradiometers
    spectral reflectance
    substitutes

    Keywords

    • plants (botany)
    • reflection
    • analytical equations
    • diffuse reflectance
    • integrating spheres
    • spectral reflectances
    • spectro-radiometers
    • substitution method
    • theoretical algorithms
    • transmittance and reflectances

    Cite this

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    title = "Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra",
    abstract = "We present the theoretical background and analytical equations for calculating spectral reflectance and transmittance factors for plant leaves from data collected by a field spectroradiometer attached to a double-integrating sphere. The sphere constants required for the calculations are derived from measurements of an empty sample port and a diffuse reflectance panel. The new method is applied in measuring the spectra of leaves belonging to 13 tree species. The greatest advantages of a double-sphere system compared with the conventional single-sphere substitution method is the speed of measurements, ease of operation, and increased portability and field-ruggedness.",
    keywords = "plants (botany), reflection, analytical equations, diffuse reflectance, integrating spheres, spectral reflectances, spectro-radiometers, substitution method, theoretical algorithms, transmittance and reflectances",
    author = "Matti M{\~o}ttus and Aarne Hovi and Miina Rautiainen",
    note = "CA2: BA1404 Project code: 113325 AU2: M{\~o}ttus, Matti",
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    Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra. / Mõttus, Matti; Hovi, Aarne; Rautiainen, Miina.

    In: Applied Optics, Vol. 56, No. 3, 20.01.2017, p. 563-571.

    Research output: Contribution to journalArticleScientificpeer-review

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    T1 - Theoretical algorithm and application of a double-integrating sphere system for measuring leaf transmittance and reflectance spectra

    AU - Mõttus, Matti

    AU - Hovi, Aarne

    AU - Rautiainen, Miina

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    PY - 2017/1/20

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    AB - We present the theoretical background and analytical equations for calculating spectral reflectance and transmittance factors for plant leaves from data collected by a field spectroradiometer attached to a double-integrating sphere. The sphere constants required for the calculations are derived from measurements of an empty sample port and a diffuse reflectance panel. The new method is applied in measuring the spectra of leaves belonging to 13 tree species. The greatest advantages of a double-sphere system compared with the conventional single-sphere substitution method is the speed of measurements, ease of operation, and increased portability and field-ruggedness.

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    KW - reflection

    KW - analytical equations

    KW - diffuse reflectance

    KW - integrating spheres

    KW - spectral reflectances

    KW - spectro-radiometers

    KW - substitution method

    KW - theoretical algorithms

    KW - transmittance and reflectances

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