Theory of the Bloch oscillating transistor

Juha Hassel (Corresponding Author), Heikki Seppä

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)

Abstract

The Bloch oscillating transistor (BOT) is a device in which single electron current through a normal tunnel junction enhances Cooper pair current in a mesoscopic Josephson junction, leading to signal amplification. In this article we develop a theory in which the BOT dynamics is described as a two-level system. The theory is used to predict current–voltage characteristics and small-signal response. The transition from stable operation into the hysteretic regime is studied. By identifying the two-level switching noise as the main source of fluctuations, the expressions for equivalent noise sources and the noise temperature are derived. The validity of the model is tested by comparing the results with simulations and experiments.
Original languageEnglish
Article number023904
Number of pages6
JournalJournal of Applied Physics
Volume97
Issue number2
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Fingerprint

transistors
noise temperature
tunnel junctions
Josephson junctions
electrons
simulation

Keywords

  • superconducting transistors
  • superconducting device noise
  • Josephson effect
  • Josephson junction
  • Cooper pairs
  • fluctuations in superconductors
  • electrical conductivity transitions

Cite this

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title = "Theory of the Bloch oscillating transistor",
abstract = "The Bloch oscillating transistor (BOT) is a device in which single electron current through a normal tunnel junction enhances Cooper pair current in a mesoscopic Josephson junction, leading to signal amplification. In this article we develop a theory in which the BOT dynamics is described as a two-level system. The theory is used to predict current–voltage characteristics and small-signal response. The transition from stable operation into the hysteretic regime is studied. By identifying the two-level switching noise as the main source of fluctuations, the expressions for equivalent noise sources and the noise temperature are derived. The validity of the model is tested by comparing the results with simulations and experiments.",
keywords = "superconducting transistors, superconducting device noise, Josephson effect, Josephson junction, Cooper pairs, fluctuations in superconductors, electrical conductivity transitions",
author = "Juha Hassel and Heikki Sepp{\"a}",
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}

Theory of the Bloch oscillating transistor. / Hassel, Juha (Corresponding Author); Seppä, Heikki.

In: Journal of Applied Physics, Vol. 97, No. 2, 023904, 2005.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Theory of the Bloch oscillating transistor

AU - Hassel, Juha

AU - Seppä, Heikki

N1 - Project code: T3SU00197

PY - 2005

Y1 - 2005

N2 - The Bloch oscillating transistor (BOT) is a device in which single electron current through a normal tunnel junction enhances Cooper pair current in a mesoscopic Josephson junction, leading to signal amplification. In this article we develop a theory in which the BOT dynamics is described as a two-level system. The theory is used to predict current–voltage characteristics and small-signal response. The transition from stable operation into the hysteretic regime is studied. By identifying the two-level switching noise as the main source of fluctuations, the expressions for equivalent noise sources and the noise temperature are derived. The validity of the model is tested by comparing the results with simulations and experiments.

AB - The Bloch oscillating transistor (BOT) is a device in which single electron current through a normal tunnel junction enhances Cooper pair current in a mesoscopic Josephson junction, leading to signal amplification. In this article we develop a theory in which the BOT dynamics is described as a two-level system. The theory is used to predict current–voltage characteristics and small-signal response. The transition from stable operation into the hysteretic regime is studied. By identifying the two-level switching noise as the main source of fluctuations, the expressions for equivalent noise sources and the noise temperature are derived. The validity of the model is tested by comparing the results with simulations and experiments.

KW - superconducting transistors

KW - superconducting device noise

KW - Josephson effect

KW - Josephson junction

KW - Cooper pairs

KW - fluctuations in superconductors

KW - electrical conductivity transitions

U2 - 10.1063/1.1831553

DO - 10.1063/1.1831553

M3 - Article

VL - 97

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 2

M1 - 023904

ER -