@inproceedings{daa7868382d74ee9a808902d74e6b0de,
title = "Thermal characterisation as a part of reliability testing of THz schottky diodes",
abstract = "This paper presents the most common thermal characterisation methods for semiconductor diodes and discusses why thermal characterisation is important for the diode reliability assessment. A special case of thermal characterisation of THz frequency Schottky diodes for MetOp Second Generation (MetOp-SG) satellite program instruments is covered in more detail. The benefits of accurate thermal characterisation in this case are explained and the drawbacks of unknown self-heating are discussed",
author = "Tero Kiuru and Subash Khanal and Juha Mallat and R{\"a}is{\"a}nen, {Antti V.} and Tapani N{\"a}rhi",
note = "Project code: 78177; XXXIII URSI Convention on Radio Science ; Conference date: 24-04-2013 Through 25-04-2013",
year = "2013",
language = "English",
isbn = "978-952-60-5142-0",
series = "Aalto University Publication Series Science + Technology",
publisher = "Aalto University",
number = "8/2013",
pages = "121--123",
editor = "Sihvola, {Ari H.} and Henrik Wall{\'e}n",
booktitle = "XXXIII URSI Convention on Radio Science and SMARAD Seminar 2013",
address = "Finland",
}