Abstract
This paper presents the most common thermal characterisation methods for
semiconductor diodes and discusses why thermal characterisation is important
for the diode reliability assessment. A special case of thermal
characterisation of THz frequency Schottky diodes for MetOp Second Generation
(MetOp-SG) satellite program instruments is covered in more detail. The
benefits of accurate thermal characterisation in this case are explained and
the drawbacks of unknown self-heating are discussed
Original language | English |
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Title of host publication | Proceedings |
Subtitle of host publication | XXXIII URSI Convention on Radio Science |
Place of Publication | Helsinki |
Publisher | Aalto University |
Pages | 121-123 |
ISBN (Print) | 978-952-60-5142-0 |
Publication status | Published - 2013 |
MoE publication type | Not Eligible |
Event | XXXIII URSI Convention on Radio Science - Espoo, Finland Duration: 24 Apr 2013 → 25 Apr 2013 |
Conference
Conference | XXXIII URSI Convention on Radio Science |
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Country/Territory | Finland |
City | Espoo |
Period | 24/04/13 → 25/04/13 |