Thermometry by micro and nanodevices

E. Isosaari, T. Holmqvist, M. Meschke, M. Heinonen, J. P. Pekola

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)

Abstract

In this paper we briefly discuss the current provisional temperature scale of 2000 (PLTS-2000) for low temperatures. Electronic thermometry is presented and discussed, focusing on its potential in verifying and realizing a future temperature scale. The discussion covers secondary thermometers such as NIS and SIS thermometers and noise, shot noise and Coulomb blockade primary thermometers. The last one is discussed in more detail.

Original languageEnglish
Pages (from-to)323-332
Number of pages10
JournalEuropean Physical Journal: Special Topics
Volume172
Issue number1
DOIs
Publication statusPublished - 21 Jun 2009
MoE publication typeA1 Journal article-refereed

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Thermometers
thermometers
Temperature scales
temperature measurement
temperature scales
Coulomb blockade
Shot noise
shot noise
electronics
Temperature

Cite this

Isosaari, E. ; Holmqvist, T. ; Meschke, M. ; Heinonen, M. ; Pekola, J. P. / Thermometry by micro and nanodevices. In: European Physical Journal: Special Topics. 2009 ; Vol. 172, No. 1. pp. 323-332.
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Isosaari, E, Holmqvist, T, Meschke, M, Heinonen, M & Pekola, JP 2009, 'Thermometry by micro and nanodevices', European Physical Journal: Special Topics, vol. 172, no. 1, pp. 323-332. https://doi.org/10.1140/epjst/e2009-01057-y

Thermometry by micro and nanodevices. / Isosaari, E.; Holmqvist, T.; Meschke, M.; Heinonen, M.; Pekola, J. P.

In: European Physical Journal: Special Topics, Vol. 172, No. 1, 21.06.2009, p. 323-332.

Research output: Contribution to journalArticleScientificpeer-review

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AU - Heinonen, M.

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