Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy
- Antti O. Kivioja
- , Anna-Stiina Jääskeläinen*
- , Ville Ahtee
- , Tapani Vuorinen
*Corresponding author for this work
- Aalto University
- Centre for Metrology and Accreditation Finland (MIKES)
Research output: Contribution to journal › Article › Scientific › peer-review
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