Thin-film chemical sensors with waveguide Zeeman interferometry

Pekka Äyräs, Seppo Honkanen, K. Grace, K. Shrouf, Pekka Katila, Matti Leppihalme, Ari Tervonen, X. Yang, B. Swanson, Nasser Peyghambarian

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)

Abstract

We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.
Original languageEnglish
Pages (from-to)1261-1271
JournalPure and Applied Optics: Journal of the European Optical Society. Part A
Volume7
Issue number6
DOIs
Publication statusPublished - 1998
MoE publication typeA1 Journal article-refereed

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