Thin-film chemical sensors with waveguide Zeeman interferometry

Pekka Äyräs; Seppo Honkanen; K. Grace; K. Shrouf; Pekka Katila; Matti Leppihalme; Ari Tervonen; X. Yang; B. Swanson; Nasser Peyghambarian

doi:10.1088/0963-9659/7/6/006

Thin-film chemical sensors with waveguide Zeeman interferometry

Pekka Äyräs
, Seppo Honkanen
, K. Grace
, K. Shrouf
, Pekka Katila
, Matti Leppihalme
, Ari Tervonen
, X. Yang
, B. Swanson
, Nasser Peyghambarian

VTT Technical Research Centre of Finland

University of Arizona
Los Alamos National Laboratory
Nokia Oyj

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Abstract

We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.

Original language	English
Pages (from-to)	1261-1271
Journal	Pure and Applied Optics: Journal of the European Optical Society. Part A
Volume	7
Issue number	6
DOIs	https://doi.org/10.1088/0963-9659/7/6/006
Publication status	Published - 1998
MoE publication type	A1 Journal article-refereed

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10.1088/0963-9659/7/6/006

Cite this

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abstract = "We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.",

author = "Pekka {\"A}yr{\"a}s and Seppo Honkanen and K. Grace and K. Shrouf and Pekka Katila and Matti Leppihalme and Ari Tervonen and X. Yang and B. Swanson and Nasser Peyghambarian",

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T1 - Thin-film chemical sensors with waveguide Zeeman interferometry

AU - Äyräs, Pekka

AU - Honkanen, Seppo

AU - Grace, K.

AU - Shrouf, K.

AU - Katila, Pekka

AU - Leppihalme, Matti

AU - Tervonen, Ari

AU - Yang, X.

AU - Swanson, B.

AU - Peyghambarian, Nasser

PY - 1998

Y1 - 1998

N2 - We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.

AB - We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.

U2 - 10.1088/0963-9659/7/6/006

DO - 10.1088/0963-9659/7/6/006

M3 - Article

SN - 0963-9659

VL - 7

SP - 1261

EP - 1271

JO - Pure and Applied Optics: Journal of the European Optical Society. Part A

JF - Pure and Applied Optics: Journal of the European Optical Society. Part A

IS - 6

ER -

Thin-film chemical sensors with waveguide Zeeman interferometry

Abstract

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