Thin-film cryogenic current comparator

Heikki Seppä, Alexandre Satrapinski, Mikko Kiviranta, Vesa Virkki

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    Abstract

    We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.
    Original languageEnglish
    Title of host publication1998 Conference on Precision Electromagnetic Measurements Digest
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages159-160
    ISBN (Print)0-7803-5018-9
    DOIs
    Publication statusPublished - 1998
    MoE publication typeB3 Non-refereed article in conference proceedings
    EventConference on Precision Electromagnetic Measurements, CPEM 98 - Washington, DC, United States
    Duration: 6 Jul 199810 Jul 1998

    Conference

    ConferenceConference on Precision Electromagnetic Measurements, CPEM 98
    CountryUnited States
    CityWashington, DC
    Period6/07/9810/07/98

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