Thin-film cryogenic current comparator

Heikki Seppä; Alexandre Satrapinski; Mikko Kiviranta; Vesa Virkki

doi:10.1109/CPEM.1998.699835

Thin-film cryogenic current comparator

Heikki Seppä, Alexandre Satrapinski, Mikko Kiviranta, Vesa Virkki

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific

Abstract

We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.

Original language	English
Title of host publication	1998 Conference on Precision Electromagnetic Measurements Digest
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	159-160
ISBN (Print)	0-7803-5018-9
DOIs	https://doi.org/10.1109/CPEM.1998.699835
Publication status	Published - 1998
MoE publication type	B3 Non-refereed article in conference proceedings
Event	Conference on Precision Electromagnetic Measurements, CPEM 98 - Washington, DC, United States Duration: 6 Jul 1998 → 10 Jul 1998

Conference

Conference	Conference on Precision Electromagnetic Measurements, CPEM 98
Country/Territory	United States
City	Washington, DC
Period	6/07/98 → 10/07/98

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10.1109/CPEM.1998.699835

Cite this

@inproceedings{0a733773829e4528a30ddcebf43b21fb,

title = "Thin-film cryogenic current comparator",

abstract = "We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.",

author = "Heikki Sepp{\"a} and Alexandre Satrapinski and Mikko Kiviranta and Vesa Virkki",

year = "1998",

doi = "10.1109/CPEM.1998.699835",

language = "English",

isbn = "0-7803-5018-9",

pages = "159--160",

booktitle = "1998 Conference on Precision Electromagnetic Measurements Digest",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "Conference on Precision Electromagnetic Measurements, CPEM 98 ; Conference date: 06-07-1998 Through 10-07-1998",

}

Seppä, H, Satrapinski, A, Kiviranta, M & Virkki, V 1998, Thin-film cryogenic current comparator. in 1998 Conference on Precision Electromagnetic Measurements Digest. IEEE Institute of Electrical and Electronic Engineers, pp. 159-160, Conference on Precision Electromagnetic Measurements, CPEM 98, Washington, DC, District of Columbia, United States, 6/07/98. https://doi.org/10.1109/CPEM.1998.699835

TY - GEN

T1 - Thin-film cryogenic current comparator

AU - Seppä, Heikki

AU - Satrapinski, Alexandre

AU - Kiviranta, Mikko

AU - Virkki, Vesa

PY - 1998

Y1 - 1998

N2 - We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.

AB - We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.

U2 - 10.1109/CPEM.1998.699835

DO - 10.1109/CPEM.1998.699835

M3 - Conference article in proceedings

SN - 0-7803-5018-9

SP - 159

EP - 160

BT - 1998 Conference on Precision Electromagnetic Measurements Digest

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - Conference on Precision Electromagnetic Measurements, CPEM 98

Y2 - 6 July 1998 through 10 July 1998

ER -

Thin-film cryogenic current comparator

Abstract

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