Abstract
A thin film process for the fabrication of Nb/NbOx/(Pb-In-Au) Josephson junctions has been developed. This process is primarily based on the lift-off of photoresist treated with toluene, ion beam etching of junction areas, d.c. plasma oxidation and thin film vacuum deposition techniques. The device characteristics are described in terms of the processing parameters.
| Original language | English |
|---|---|
| Pages (from-to) | 77-81 |
| Journal | Thin Solid Films |
| Volume | 126 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 1985 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- Josephson junction
- devices
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