Thin polyaniline films in EMI shielding

Tapio Mäkelä, Seppo Pienimaa, Tapani Taka, Salme Jussila, Heikki Isotalo

Research output: Contribution to journalArticleScientificpeer-review

154 Citations (Scopus)

Abstract

Electromagnetic interference shielding efficiency has been measured for highly electrically conducting Polyaniline-Camphor Sulfonic Acid. The polymer is spin coated from m-cresol solution on an electrically insulating substrate as a 1–30 μm thick layer having a conductivity of 10–100 S/cm. The shielding efficiencies (SE) for these electrically thin polyaniline films have been measured in the near-field with a dual-chamber box and in the far-field with a transmission line method in the frequency range 0.1–1000 MHz. The measurements show that SE depends primarily on the surface resistance both in the far-field and the near-field. An additional effect >10 dB is seen when the two layer structure is measured in the near field. By using layer structures, the SE is >40 dB up to ca. 100 MHz in the near-field and 39 dB at 1 GHz in the far-field.

Original languageEnglish
Pages (from-to)1335 - 1336
Number of pages2
JournalSynthetic Metals
Volume85
Issue number1-3
DOIs
Publication statusPublished - 1997
MoE publication typeA1 Journal article-refereed

Fingerprint Dive into the research topics of 'Thin polyaniline films in EMI shielding'. Together they form a unique fingerprint.

  • Cite this

    Mäkelä, T., Pienimaa, S., Taka, T., Jussila, S., & Isotalo, H. (1997). Thin polyaniline films in EMI shielding. Synthetic Metals, 85(1-3), 1335 - 1336. https://doi.org/10.1016/S0379-6779(97)80259-7