Thin polyaniline films in EMI shielding

Tapio Mäkelä; Seppo Pienimaa; Tapani Taka; Salme Jussila; Heikki Isotalo

Thin polyaniline films in EMI shielding

Tapio Mäkelä, Seppo Pienimaa, Tapani Taka, Salme Jussila, Heikki Isotalo

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Electromagnetic interference shielding efficiency has been measured for highly electrically conducting Polyaniline-Camphor Sulfonic Acid. The polymer is spin coated from m-cresol solution on an electrically insulating substrate as a 1–30 μm thick layer having a conductivity of 10–100 S/cm. The shielding efficiencies (SE) for these electrically thin polyaniline films have been measured in the near-field with a dual-chamber box and in the far-field with a transmission line method in the frequency range 0.1–1000 MHz. The measurements show that SE depends primarily on the surface resistance both in the far-field and the near-field. An additional effect >10 dB is seen when the two layer structure is measured in the near field. By using layer structures, the SE is >40 dB up to ca. 100 MHz in the near-field and 39 dB at 1 GHz in the far-field.

Original language	English
Title of host publication	Proceedings of the International Conference on Science and Technology of Synthetic Metals (ICSM '96)
Subtitle of host publication	Electronic polymers II
Editors	Z. Valy Vardeny, Arthur J. Epstein
Place of Publication	Amsterdam
Publisher	Elsevier
Pages	1335-1336
Volume	2
ISBN (Print)	978-0-444-20510-0
Publication status	Published - 1997
MoE publication type	A4 Article in a conference publication
Event	International Conference on Science and Technology of Synthetic Metals ICSM '96 - Snowbird, United States Duration: 28 Jul 1996 → 2 Aug 1996

Conference

Conference	International Conference on Science and Technology of Synthetic Metals ICSM '96
Country/Territory	United States
City	Snowbird
Period	28/07/96 → 2/08/96

1 Article

Thin polyaniline films in EMI shielding
Mäkelä, T., Pienimaa, S., Taka, T., Jussila, S. & Isotalo, H., 1997, In: Synthetic Metals. 85, 1-3, p. 1335-1336
Research output: Contribution to journal › Article › Scientific › peer-review
187 Citations (Scopus)

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@inproceedings{d0d779787ec2482a9eec1dff35d32b6e,

title = "Thin polyaniline films in EMI shielding",

abstract = "Electromagnetic interference shielding efficiency has been measured for highly electrically conducting Polyaniline-Camphor Sulfonic Acid. The polymer is spin coated from m-cresol solution on an electrically insulating substrate as a 1–30 μm thick layer having a conductivity of 10–100 S/cm. The shielding efficiencies (SE) for these electrically thin polyaniline films have been measured in the near-field with a dual-chamber box and in the far-field with a transmission line method in the frequency range 0.1–1000 MHz. The measurements show that SE depends primarily on the surface resistance both in the far-field and the near-field. An additional effect >10 dB is seen when the two layer structure is measured in the near field. By using layer structures, the SE is >40 dB up to ca. 100 MHz in the near-field and 39 dB at 1 GHz in the far-field.",

author = "Tapio M{\"a}kel{\"a} and Seppo Pienimaa and Tapani Taka and Salme Jussila and Heikki Isotalo",

year = "1997",

language = "English",

isbn = "978-0-444-20510-0",

volume = "2",

pages = "1335--1336",

editor = "Vardeny, \{Z. Valy\} and Epstein, \{Arthur J.\}",

booktitle = "Proceedings of the International Conference on Science and Technology of Synthetic Metals (ICSM '96)",

publisher = "Elsevier",

address = "Netherlands",

note = "International Conference on Science and Technology of Synthetic Metals ICSM '96 ; Conference date: 28-07-1996 Through 02-08-1996",

}

Mäkelä, T, Pienimaa, S, Taka, T, Jussila, S & Isotalo, H 1997, Thin polyaniline films in EMI shielding. in ZV Vardeny & AJ Epstein (eds), Proceedings of the International Conference on Science and Technology of Synthetic Metals (ICSM '96): Electronic polymers II. vol. 2, Elsevier, Amsterdam, pp. 1335-1336, International Conference on Science and Technology of Synthetic Metals ICSM '96, Snowbird, Utah, United States, 28/07/96.

Thin polyaniline films in EMI shielding. / Mäkelä, Tapio; Pienimaa, Seppo; Taka, Tapani et al.
Proceedings of the International Conference on Science and Technology of Synthetic Metals (ICSM '96): Electronic polymers II. ed. / Z. Valy Vardeny; Arthur J. Epstein. Vol. 2 Amsterdam: Elsevier, 1997. p. 1335-1336.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Thin polyaniline films in EMI shielding

AU - Mäkelä, Tapio

AU - Pienimaa, Seppo

AU - Taka, Tapani

AU - Jussila, Salme

AU - Isotalo, Heikki

PY - 1997

Y1 - 1997

N2 - Electromagnetic interference shielding efficiency has been measured for highly electrically conducting Polyaniline-Camphor Sulfonic Acid. The polymer is spin coated from m-cresol solution on an electrically insulating substrate as a 1–30 μm thick layer having a conductivity of 10–100 S/cm. The shielding efficiencies (SE) for these electrically thin polyaniline films have been measured in the near-field with a dual-chamber box and in the far-field with a transmission line method in the frequency range 0.1–1000 MHz. The measurements show that SE depends primarily on the surface resistance both in the far-field and the near-field. An additional effect >10 dB is seen when the two layer structure is measured in the near field. By using layer structures, the SE is >40 dB up to ca. 100 MHz in the near-field and 39 dB at 1 GHz in the far-field.

AB - Electromagnetic interference shielding efficiency has been measured for highly electrically conducting Polyaniline-Camphor Sulfonic Acid. The polymer is spin coated from m-cresol solution on an electrically insulating substrate as a 1–30 μm thick layer having a conductivity of 10–100 S/cm. The shielding efficiencies (SE) for these electrically thin polyaniline films have been measured in the near-field with a dual-chamber box and in the far-field with a transmission line method in the frequency range 0.1–1000 MHz. The measurements show that SE depends primarily on the surface resistance both in the far-field and the near-field. An additional effect >10 dB is seen when the two layer structure is measured in the near field. By using layer structures, the SE is >40 dB up to ca. 100 MHz in the near-field and 39 dB at 1 GHz in the far-field.

M3 - Conference article in proceedings

SN - 978-0-444-20510-0

VL - 2

SP - 1335

EP - 1336

BT - Proceedings of the International Conference on Science and Technology of Synthetic Metals (ICSM '96)

A2 - Vardeny, Z. Valy

A2 - Epstein, Arthur J.

PB - Elsevier

CY - Amsterdam

T2 - International Conference on Science and Technology of Synthetic Metals ICSM '96

Y2 - 28 July 1996 through 2 August 1996

ER -

Thin polyaniline films in EMI shielding

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Research output

Thin polyaniline films in EMI shielding

Cite this