Time-resolved frequency chirp measurement using a silicon-wafer etalon

Simo Tammela, Hanne Ludvigsen, Timo Kajava, Matti Kaivola

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)

Abstract

A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.
Original languageEnglish
Pages (from-to)475 - 477
Number of pages3
JournalIEEE Photonics Technology Letters
Volume9
Issue number4
DOIs
Publication statusPublished - 1997
MoE publication typeA1 Journal article-refereed

Fingerprint

Discriminators
Optical communication
chirp
Silicon wafers
Light sources
Communication systems
frequency discriminators
wafers
Polarization
silicon
optical communication
telecommunication
light sources
polarization
finesse

Cite this

Tammela, Simo ; Ludvigsen, Hanne ; Kajava, Timo ; Kaivola, Matti. / Time-resolved frequency chirp measurement using a silicon-wafer etalon. In: IEEE Photonics Technology Letters. 1997 ; Vol. 9, No. 4. pp. 475 - 477.
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abstract = "A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.",
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Tammela, S, Ludvigsen, H, Kajava, T & Kaivola, M 1997, 'Time-resolved frequency chirp measurement using a silicon-wafer etalon', IEEE Photonics Technology Letters, vol. 9, no. 4, pp. 475 - 477. https://doi.org/10.1109/68.559393

Time-resolved frequency chirp measurement using a silicon-wafer etalon. / Tammela, Simo; Ludvigsen, Hanne; Kajava, Timo; Kaivola, Matti.

In: IEEE Photonics Technology Letters, Vol. 9, No. 4, 1997, p. 475 - 477.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Time-resolved frequency chirp measurement using a silicon-wafer etalon

AU - Tammela, Simo

AU - Ludvigsen, Hanne

AU - Kajava, Timo

AU - Kaivola, Matti

PY - 1997

Y1 - 1997

N2 - A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

AB - A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

U2 - 10.1109/68.559393

DO - 10.1109/68.559393

M3 - Article

VL - 9

SP - 475

EP - 477

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

SN - 1041-1135

IS - 4

ER -