Time-resolved frequency chirp measurement using a silicon-wafer etalon

Simo Tammela; Hanne Ludvigsen; Timo Kajava; Matti Kaivola

doi:10.1109/68.559393

Time-resolved frequency chirp measurement using a silicon-wafer etalon

Simo Tammela, Hanne Ludvigsen, Timo Kajava, Matti Kaivola

VTT Technical Research Centre of Finland

Helsinki University of Technology

Research output: Contribution to journal › Article › Scientific › peer-review

19 Citations (Scopus)

Abstract

A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

Original language	English
Pages (from-to)	475-477
Journal	IEEE Photonics Technology Letters
Volume	9
Issue number	4
DOIs	https://doi.org/10.1109/68.559393
Publication status	Published - 1997
MoE publication type	A1 Journal article-refereed

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10.1109/68.559393

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title = "Time-resolved frequency chirp measurement using a silicon-wafer etalon",

abstract = "A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.",

author = "Simo Tammela and Hanne Ludvigsen and Timo Kajava and Matti Kaivola",

year = "1997",

doi = "10.1109/68.559393",

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journal = "IEEE Photonics Technology Letters",

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T1 - Time-resolved frequency chirp measurement using a silicon-wafer etalon

AU - Tammela, Simo

AU - Ludvigsen, Hanne

AU - Kajava, Timo

AU - Kaivola, Matti

PY - 1997

Y1 - 1997

N2 - A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

AB - A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.

U2 - 10.1109/68.559393

DO - 10.1109/68.559393

M3 - Article

SN - 1041-1135

VL - 9

SP - 475

EP - 477

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

IS - 4

ER -

Time-resolved frequency chirp measurement using a silicon-wafer etalon

Abstract

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