Time-resolved frequency chirp measurement using a silicon-wafer etalon

Simo Tammela, Hanne Ludvigsen, Timo Kajava, Matti Kaivola

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)

Abstract

A new method for determination of time-resolved frequency chirp in modulated light sources of optical communication systems is presented. A thin silicon wafer acting as a low-finesse etalon was used as an optical frequency discriminator. The method provides a polarization-insensitive way to easily characterize the frequency chirp with high time-resolution.
Original languageEnglish
Pages (from-to)475-477
JournalIEEE Photonics Technology Letters
Volume9
Issue number4
DOIs
Publication statusPublished - 1997
MoE publication typeA1 Journal article-refereed

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