Timing error detection in ultra dynamic voltage scaling systems

L. Koskinen, M. Turnquist, M. Hiienkari, Jani Mäkipää

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publicationIEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
PublisherInstitute of Electrical and Electronic Engineers IEEE
ISBN (Electronic)978-1-4673-4681-8
ISBN (Print)978-1-4673-4682-5
DOIs
Publication statusPublished - 2012
MoE publication typeNot Eligible
EventIEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 - Eilat, Israel
Duration: 14 Nov 201217 Nov 2012

Conference

ConferenceIEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
Abbreviated titleIEEEI 2012
CountryIsrael
CityEilat
Period14/11/1217/11/12

Fingerprint

Error detection
Electric potential
Aging of materials
Throughput
Voltage scaling
Microprocessor chips
Temperature

Keywords

  • Timing-Error Detection
  • Ultra-Dynamic Voltage Scaling
  • Ultra-Low Power

Cite this

Koskinen, L., Turnquist, M., Hiienkari, M., & Mäkipää, J. (2012). Timing error detection in ultra dynamic voltage scaling systems. In Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 [6377042] Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/EEEI.2012.6377042
Koskinen, L. ; Turnquist, M. ; Hiienkari, M. ; Mäkipää, Jani. / Timing error detection in ultra dynamic voltage scaling systems. Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. Institute of Electrical and Electronic Engineers IEEE, 2012.
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Koskinen, L, Turnquist, M, Hiienkari, M & Mäkipää, J 2012, Timing error detection in ultra dynamic voltage scaling systems. in Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012., 6377042, Institute of Electrical and Electronic Engineers IEEE, IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, Eilat, Israel, 14/11/12. https://doi.org/10.1109/EEEI.2012.6377042

Timing error detection in ultra dynamic voltage scaling systems. / Koskinen, L.; Turnquist, M.; Hiienkari, M.; Mäkipää, Jani.

Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. Institute of Electrical and Electronic Engineers IEEE, 2012. 6377042.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AU - Hiienkari, M.

AU - Mäkipää, Jani

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Y1 - 2012

N2 - Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .

AB - Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .

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Koskinen L, Turnquist M, Hiienkari M, Mäkipää J. Timing error detection in ultra dynamic voltage scaling systems. In Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. Institute of Electrical and Electronic Engineers IEEE. 2012. 6377042 https://doi.org/10.1109/EEEI.2012.6377042