Timing error detection in ultra dynamic voltage scaling systems

L. Koskinen; M. Turnquist; M. Hiienkari; Jani Mäkipää

doi:10.1109/EEEI.2012.6377042

Timing error detection in ultra dynamic voltage scaling systems

L. Koskinen
, M. Turnquist
, M. Hiienkari
, Jani Mäkipää

VTT Technical Research Centre of Finland

Aalto University

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Abstract

Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .

Original language	English
Title of host publication	Proceedings
Subtitle of host publication	IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
Publisher	IEEE Institute of Electrical and Electronic Engineers
ISBN (Electronic)	978-1-4673-4681-8
ISBN (Print)	978-1-4673-4682-5
DOIs	https://doi.org/10.1109/EEEI.2012.6377042
Publication status	Published - 2012
MoE publication type	Not Eligible
Event	IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 - Eilat, Israel Duration: 14 Nov 2012 → 17 Nov 2012

Conference

Conference	IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
Abbreviated title	IEEEI 2012
Country/Territory	Israel
City	Eilat
Period	14/11/12 → 17/11/12

Keywords

Timing-Error Detection
Ultra-Dynamic Voltage Scaling
Ultra-Low Power

Access to Document

10.1109/EEEI.2012.6377042

Cite this

@inproceedings{6c26616a251540cd9cdbbe7be2e17b31,

title = "Timing error detection in ultra dynamic voltage scaling systems",

abstract = "Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .",

keywords = "Timing-Error Detection, Ultra-Dynamic Voltage Scaling, Ultra-Low Power",

author = "L. Koskinen and M. Turnquist and M. Hiienkari and Jani M{\"a}kip{\"a}{\"a}",

year = "2012",

doi = "10.1109/EEEI.2012.6377042",

language = "English",

isbn = "978-1-4673-4682-5",

booktitle = "Proceedings",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, IEEEI 2012 ; Conference date: 14-11-2012 Through 17-11-2012",

}

Koskinen, L, Turnquist, M, Hiienkari, M & Mäkipää, J 2012, Timing error detection in ultra dynamic voltage scaling systems. in Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012., 6377042, IEEE Institute of Electrical and Electronic Engineers, IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, Eilat, Israel, 14/11/12. https://doi.org/10.1109/EEEI.2012.6377042

Timing error detection in ultra dynamic voltage scaling systems. / Koskinen, L.; Turnquist, M.; Hiienkari, M. et al.
Proceedings: IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. IEEE Institute of Electrical and Electronic Engineers, 2012. 6377042.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Timing error detection in ultra dynamic voltage scaling systems

AU - Koskinen, L.

AU - Turnquist, M.

AU - Hiienkari, M.

AU - Mäkipää, Jani

PY - 2012

Y1 - 2012

N2 - Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .

AB - Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold voltages. However, throughput of a system is severely limited at ultra-low operation voltages. Therefore, it would be ideal to have the system operate across a wide voltage range but achieving minimum energy operation simultaneously with operation over the entire voltage range is challenging. Further, process, supply voltage, temperature, and aging (PVTA) induced variation becomes a design challenge. In order to conform to varying throughput requirements and to compensate for PVTA variations, an adaptive design is required. In this paper, an extension to a previously presented subthreshold Timing-Error Detection (TED) microprocessor is proposed. The extension allows the system to operate efficiently at both low and high operation frequencies from 300 mV to 1.2 V .

KW - Timing-Error Detection

KW - Ultra-Dynamic Voltage Scaling

KW - Ultra-Low Power

U2 - 10.1109/EEEI.2012.6377042

DO - 10.1109/EEEI.2012.6377042

M3 - Conference article in proceedings

SN - 978-1-4673-4682-5

BT - Proceedings

PB - IEEE Institute of Electrical and Electronic Engineers

T2 - IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

Y2 - 14 November 2012 through 17 November 2012

ER -

Timing error detection in ultra dynamic voltage scaling systems

Abstract

Conference

Keywords

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