@inproceedings{0eb880003b8c4b1799af990d42570404,
title = "Total internal reflection mirrors with ultra-low losses in 3 µm thick SOI waveguides",
abstract = "Total internal reflection (TIR) mirrors represent an ultra-compact and flexible method to turn light in a photonic integrated circuit (PIC). These can also have very broadband and polarisation independent operation. This paper presents results from 90 degree strip waveguide turning mirrors with novel geometry on a 3 µm SOI waveguide platform. The new TIR mirrors have record-low insertion loss of 0.08 dB/mirror. They are compared with previous designs that have demonstrated insertion losses down to 0.15 dB/mirror. The test structures consisted of up to 96 consecutive mirrors and were fabricated in a multi-project wafer run. The multi-moded test devices only propagate light in the fundamental mode. The mirrors can be used in single-mode PICs that combine low losses, small polarisation dependency, wide bandwidth and small footprint.",
keywords = "elliptic mirror, photonic integrated circuit, PIC, slicon photonics, silicon-on-insulator, SOI, TIR, total internal reflection, waveguide mirror",
author = "Timo Aalto and Mikko Harjanne and Sami Ylinen and Markku Kapulainen and Tapani Vehmas and Matteo Cherchi",
year = "2015",
month = feb,
day = "27",
doi = "10.1117/12.2079748",
language = "English",
isbn = "978-1-6284-1457-8",
series = "Proceedings of SPIE",
publisher = "International Society for Optics and Photonics SPIE",
editor = "Reed, {Graham T.} and Watts, {Michael R.}",
booktitle = "Silicon Photonics X",
address = "United States",
note = "Silicon Photonics X, SPIE OPTO ; Conference date: 09-02-2015 Through 12-02-2015",
}