Towards a dc SQUID read-out for the normal metal hot-electron microbolometer

M. Tarasov; S. Gudoshnikov; A. Kalabukhov; Heikki Seppä; Mikko Kiviranta; L. Kuzmin

doi:10.1016/S0921-4534(01)01159-5

Towards a dc SQUID read-out for the normal metal hot-electron microbolometer

M. Tarasov (Corresponding Author), S. Gudoshnikov, A. Kalabukhov, Heikki Seppä, Mikko Kiviranta, L. Kuzmin

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Abstract

A prototype of SQUID read-out for current measurements at the output of a normal metal hot-electron microbolometer has been developed and tested. The system is based on serial VTT dc SQUID and input μ-metal core solenoid transformer. The achieved current resolution is 300 fA/Hz1/2. Johnson noise of metal resistor and shot noise of tunnel junction were used for current calibration of SQUID read-out. The current noise spectra of 35 k SIN tunnel junction measured at different bias voltages are presented.

Original language	English
Pages (from-to)	161-165
Journal	Physica C: Superconductivity and its Applications
Volume	368
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4534(01)01159-5
Publication status	Published - 2002
MoE publication type	A1 Journal article-refereed

Keywords

dc SQUID
SIN tunnel junction
SQUID femtoamperemeter

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10.1016/S0921-4534(01)01159-5

Cite this

@article{1bf4d08151a14899825f6d131a0e5b6b,

title = "Towards a dc SQUID read-out for the normal metal hot-electron microbolometer",

abstract = "A prototype of SQUID read-out for current measurements at the output of a normal metal hot-electron microbolometer has been developed and tested. The system is based on serial VTT dc SQUID and input μ-metal core solenoid transformer. The achieved current resolution is 300 fA/Hz1/2. Johnson noise of metal resistor and shot noise of tunnel junction were used for current calibration of SQUID read-out. The current noise spectra of 35 k SIN tunnel junction measured at different bias voltages are presented.",

keywords = "dc SQUID, SIN tunnel junction, SQUID femtoamperemeter",

author = "M. Tarasov and S. Gudoshnikov and A. Kalabukhov and Heikki Sepp{\"a} and Mikko Kiviranta and L. Kuzmin",

year = "2002",

doi = "10.1016/S0921-4534(01)01159-5",

language = "English",

volume = "368",

pages = "161--165",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "1-4",

}

TY - JOUR

T1 - Towards a dc SQUID read-out for the normal metal hot-electron microbolometer

AU - Tarasov, M.

AU - Gudoshnikov, S.

AU - Kalabukhov, A.

AU - Seppä, Heikki

AU - Kiviranta, Mikko

AU - Kuzmin, L.

PY - 2002

Y1 - 2002

N2 - A prototype of SQUID read-out for current measurements at the output of a normal metal hot-electron microbolometer has been developed and tested. The system is based on serial VTT dc SQUID and input μ-metal core solenoid transformer. The achieved current resolution is 300 fA/Hz1/2. Johnson noise of metal resistor and shot noise of tunnel junction were used for current calibration of SQUID read-out. The current noise spectra of 35 k SIN tunnel junction measured at different bias voltages are presented.

AB - A prototype of SQUID read-out for current measurements at the output of a normal metal hot-electron microbolometer has been developed and tested. The system is based on serial VTT dc SQUID and input μ-metal core solenoid transformer. The achieved current resolution is 300 fA/Hz1/2. Johnson noise of metal resistor and shot noise of tunnel junction were used for current calibration of SQUID read-out. The current noise spectra of 35 k SIN tunnel junction measured at different bias voltages are presented.

KW - dc SQUID

KW - SIN tunnel junction

KW - SQUID femtoamperemeter

U2 - 10.1016/S0921-4534(01)01159-5

DO - 10.1016/S0921-4534(01)01159-5

M3 - Article

SN - 0921-4534

VL - 368

SP - 161

EP - 165

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

IS - 1-4

ER -

Towards a dc SQUID read-out for the normal metal hot-electron microbolometer

Abstract

Keywords

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