Towards Accurate Charge Transport with SINIS Turnstile

V.F. Maisi, O-P. Saira, Antti Kemppinen, Yu. A. Pashkin, D.V. Averin, Antti Manninen, J.P. Pekola

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publication2012 Conference on Precision electromagnetic Measurements, CPEM 2012
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages248-249
    ISBN (Electronic)978-1-4673-0442-9
    ISBN (Print)978-1-4673-0439-9
    DOIs
    Publication statusPublished - 2012
    MoE publication typeA4 Article in a conference publication

    Keywords

    • measurement standards
    • metrology
    • nanoelectronics
    • quantum mechanics
    • single electron devices
    • single electron transistors

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