Towards Accurate Charge Transport with SINIS Turnstile

V.F. Maisi, O-P. Saira, Antti Kemppinen, Yu. A. Pashkin, D.V. Averin, Antti Manninen, J.P. Pekola

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2012 Conference on Precision electromagnetic Measurements, CPEM 2012
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages248-249
ISBN (Electronic)978-1-4673-0442-9
ISBN (Print)978-1-4673-0439-9
DOIs
Publication statusPublished - 2012
MoE publication typeA4 Article in a conference publication

Keywords

  • measurement standards
  • metrology
  • nanoelectronics
  • quantum mechanics
  • single electron devices
  • single electron transistors

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