Trace reduction and pattern analysis to assist debugging in model-based testing

Teemu Kanstrén, Marsha Chechik

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Model-based testing (MBT) is a technique for generating test cases from test models. One of the benefits of MBT is the ability to have a computer generate and execute extensive test sets from the test models, achieving high coverage. However, when such large test sets are automatically generated and executed, the resulting failure traces can be very large and difficult to debug for root cause analysis. In this paper, we present a technique for minimizing the length of a failure trace, creating variants of it, and for pattern mining the trace variants to assist in root cause analysis. We demonstrate the technique on a model of a GSM SIM card.
Original languageEnglish
Title of host publicationProceedings
Subtitle of host publicationIEEE International Symposium on Software Reliability Engineering Workshops
PublisherInstitute of Electrical and Electronic Engineers IEEE
Pages238-243
ISBN (Electronic)978-1-4799-7377-4
DOIs
Publication statusPublished - 2014
MoE publication typeA4 Article in a conference publication
EventIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014 - Naples, Italy
Duration: 3 Nov 20146 Nov 2014

Conference

ConferenceIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014
Abbreviated titleISSREW 2014
CountryItaly
CityNaples
Period3/11/146/11/14

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Testing
Global system for mobile communications

Keywords

  • algorithm design and analysis
  • analytical models
  • debugging
  • generators
  • pattern analysis
  • radiation detectors
  • testing

Cite this

Kanstrén, T., & Chechik, M. (2014). Trace reduction and pattern analysis to assist debugging in model-based testing. In Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops (pp. 238-243). Institute of Electrical and Electronic Engineers IEEE. https://doi.org/10.1109/ISSREW.2014.9
Kanstrén, Teemu ; Chechik, Marsha. / Trace reduction and pattern analysis to assist debugging in model-based testing. Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. Institute of Electrical and Electronic Engineers IEEE, 2014. pp. 238-243
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Kanstrén, T & Chechik, M 2014, Trace reduction and pattern analysis to assist debugging in model-based testing. in Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. Institute of Electrical and Electronic Engineers IEEE, pp. 238-243, IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014, Naples, Italy, 3/11/14. https://doi.org/10.1109/ISSREW.2014.9

Trace reduction and pattern analysis to assist debugging in model-based testing. / Kanstrén, Teemu; Chechik, Marsha.

Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. Institute of Electrical and Electronic Engineers IEEE, 2014. p. 238-243.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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Kanstrén T, Chechik M. Trace reduction and pattern analysis to assist debugging in model-based testing. In Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. Institute of Electrical and Electronic Engineers IEEE. 2014. p. 238-243 https://doi.org/10.1109/ISSREW.2014.9