Abstract
Model-based testing (MBT) is a technique for generating
test cases from test models. One of the benefits of MBT
is the ability to have a computer generate and execute
extensive test sets from the test models, achieving high
coverage. However, when such large test sets are
automatically generated and executed, the resulting
failure traces can be very large and difficult to debug
for root cause analysis. In this paper, we present a
technique for minimizing the length of a failure trace,
creating variants of it, and for pattern mining the trace
variants to assist in root cause analysis. We demonstrate
the technique on a model of a GSM SIM card.
Original language | English |
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Title of host publication | Proceedings |
Subtitle of host publication | IEEE International Symposium on Software Reliability Engineering Workshops |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 238-243 |
ISBN (Electronic) | 978-1-4799-7377-4 |
DOIs | |
Publication status | Published - 2014 |
MoE publication type | A4 Article in a conference publication |
Event | IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014 - Naples, Italy Duration: 3 Nov 2014 → 6 Nov 2014 |
Conference
Conference | IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014 |
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Abbreviated title | ISSREW 2014 |
Country/Territory | Italy |
City | Naples |
Period | 3/11/14 → 6/11/14 |
Keywords
- algorithm design and analysis
- analytical models
- debugging
- generators
- pattern analysis
- radiation detectors
- testing