Trace reduction and pattern analysis to assist debugging in model-based testing

Teemu Kanstrén, Marsha Chechik

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Abstract

    Model-based testing (MBT) is a technique for generating test cases from test models. One of the benefits of MBT is the ability to have a computer generate and execute extensive test sets from the test models, achieving high coverage. However, when such large test sets are automatically generated and executed, the resulting failure traces can be very large and difficult to debug for root cause analysis. In this paper, we present a technique for minimizing the length of a failure trace, creating variants of it, and for pattern mining the trace variants to assist in root cause analysis. We demonstrate the technique on a model of a GSM SIM card.
    Original languageEnglish
    Title of host publicationProceedings
    Subtitle of host publicationIEEE International Symposium on Software Reliability Engineering Workshops
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages238-243
    ISBN (Electronic)978-1-4799-7377-4
    DOIs
    Publication statusPublished - 2014
    MoE publication typeA4 Article in a conference publication
    EventIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014 - Naples, Italy
    Duration: 3 Nov 20146 Nov 2014

    Conference

    ConferenceIEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014
    Abbreviated titleISSREW 2014
    CountryItaly
    CityNaples
    Period3/11/146/11/14

    Fingerprint

    Testing
    Global system for mobile communications

    Keywords

    • algorithm design and analysis
    • analytical models
    • debugging
    • generators
    • pattern analysis
    • radiation detectors
    • testing

    Cite this

    Kanstrén, T., & Chechik, M. (2014). Trace reduction and pattern analysis to assist debugging in model-based testing. In Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops (pp. 238-243). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/ISSREW.2014.9
    Kanstrén, Teemu ; Chechik, Marsha. / Trace reduction and pattern analysis to assist debugging in model-based testing. Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. IEEE Institute of Electrical and Electronic Engineers , 2014. pp. 238-243
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    Kanstrén, T & Chechik, M 2014, Trace reduction and pattern analysis to assist debugging in model-based testing. in Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. IEEE Institute of Electrical and Electronic Engineers , pp. 238-243, IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2014, Naples, Italy, 3/11/14. https://doi.org/10.1109/ISSREW.2014.9

    Trace reduction and pattern analysis to assist debugging in model-based testing. / Kanstrén, Teemu; Chechik, Marsha.

    Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. IEEE Institute of Electrical and Electronic Engineers , 2014. p. 238-243.

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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    Kanstrén T, Chechik M. Trace reduction and pattern analysis to assist debugging in model-based testing. In Proceedings: IEEE International Symposium on Software Reliability Engineering Workshops. IEEE Institute of Electrical and Electronic Engineers . 2014. p. 238-243 https://doi.org/10.1109/ISSREW.2014.9