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Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
- Yassir Arezki
- , Rong Su
- , Ville Heikkinen
- , François Leprete
- , Pavel Posta
- , Youichi Bitou
- , Christian Schober
- , Charyar Mehdi-Souzani*
- , Bandar Abdulrahman Mohammed Alzahrani
- , Xiangchao Zhang
- , Yohan Kondo
- , Christof Pruss
- , Vit Ledl
- , Nabil Anwer
- , Mohamed Lamjed Bouazizi
- , Richard Leach
- , Hichem Nouira*
*Corresponding author for this work
- Laboratoire National de Métrologie et d’Essais (LNE)
- University of Paris-Saclay
- University of Nottingham
- Centre for Metrology and Accreditation Finland (MIKES)
- Thales angénieux SA
- Czech Academy of Sciences
- National Institute of Advanced Industrial Science and Technology (AIST)
- University of Stuttgart
- Prince Sattam Bin Abdulaziz University
- Fudan University
Research output: Contribution to journal › Article › Scientific › peer-review
4
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(Scopus)
265
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