Fingerprint
Dive into the research topics of 'Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani (Corresponding Author), Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard Leach, Hichem Nouira (Corresponding Author)
- Laboratoire National de Métrologie et d'Essais (LNE)
- University of Paris-Saclay
- University of Nottingham
- Centre for Metrology and Accreditation Finland (MIKES)
- Czech Academy of Sciences
- National Institute of Advanced Industrial Science and Technology (AIST)
- University of Stuttgart
- Prince Sattam Bin Abdulaziz University
- Fudan University
- Thales angénieux SA
Research output: Contribution to journal › Article › Scientific › peer-review
2
Citations
(Scopus)
87
Downloads
(Pure)