Transfer standard for traceable dynamic calibration of stroboscopic scanning white light interferometer

Ivan Kassamakov, Anca Tureanu, Ville Heikkinen, Edward Hæggström

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The reconstructed image of a moving sample always shows a distorted representation of reality. Therefore, one needs to calibrate, for example, out-of-plane nano-videos for quality control of nano-microelectromechanical systems (N-MEMS). Here we discuss how to calibrate and obtain confidence limits for stroboscopic scanning white light interferometry (SSWLI) data when there are differences in speed and amplitude across the field of view. Many N-MEMS devices rely on oscillating structures; consequently, one must calibrate movie recordings of these structures to have global standards and to allow inter-device comparison. We propose to use a quartz tuning fork driven off-resonance as a transfer standard. This approach allows a broad range of traceable frequencies and out-of-plane amplitudes to be introduced into selected parts of the field of view of the SSWLI device featuring similar optical surface properties to many N-MEMS devices without demanding an additional reference surface.
Original languageEnglish
Pages (from-to)2483-2488
Number of pages6
JournalApplied Optics
Volume56
Issue number9
DOIs
Publication statusPublished - 20 Mar 2017
MoE publication typeA1 Journal article-refereed

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Interferometers
MEMS
interferometers
Calibration
microelectromechanical systems
Scanning
Interferometry
scanning
field of view
interferometry
confidence limits
forks
Surface properties
Quality control
Quartz
Tuning
quality control
surface properties
quartz
recording

Cite this

Kassamakov, Ivan ; Tureanu, Anca ; Heikkinen, Ville ; Hæggström, Edward. / Transfer standard for traceable dynamic calibration of stroboscopic scanning white light interferometer. In: Applied Optics. 2017 ; Vol. 56, No. 9. pp. 2483-2488.
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Transfer standard for traceable dynamic calibration of stroboscopic scanning white light interferometer. / Kassamakov, Ivan; Tureanu, Anca; Heikkinen, Ville; Hæggström, Edward.

In: Applied Optics, Vol. 56, No. 9, 20.03.2017, p. 2483-2488.

Research output: Contribution to journalArticleScientificpeer-review

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