Transistor noise characterisation at 50-94 GHz

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications
    Subtitle of host publicationCircuits, systems, and measurement techniques
    EditorsJ. Mallat, A. Räisänen, J. Tuovinen
    PublisherEuropean Space Agency (ESA)
    Pages529-533
    Publication statusPublished - 2003
    MoE publication typeA4 Article in a conference publication
    Event3rd ESA Workshop On Millimetre Wave Technology and Applications: Circuits, systems and measurement techniques - MilliLab, Espoo, Finland
    Duration: 21 May 200323 May 2003

    Publication series

    SeriesESA Conference Proceedings
    Volume212
    ISSN1022-6656

    Conference

    Conference3rd ESA Workshop On Millimetre Wave Technology and Applications
    CountryFinland
    CityEspoo
    Period21/05/0323/05/03

    Keywords

    • noise parameter measurements
    • on-wafer characterization
    • wide-band measurements

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