Transistor noise characterisation at 50-94 GHz

Mikko Kantanen; Tauno Vähä-Heikkilä; Manu Lahdes; Jussi Tuovinen

Transistor noise characterisation at 50-94 GHz

Mikko Kantanen, Tauno Vähä-Heikkilä, Manu Lahdes, Jussi Tuovinen

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications
Subtitle of host publication	Circuits, systems, and measurement techniques
Editors	J. Mallat, A. Räisänen, J. Tuovinen
Publisher	European Space Agency (ESA)
Pages	529-533
Publication status	Published - 2003
MoE publication type	A4 Article in a conference publication
Event	3rd ESA Workshop On Millimetre Wave Technology and Applications: Circuits, systems and measurement techniques - MilliLab, Espoo, Finland Duration: 21 May 2003 → 23 May 2003

Publication series

Series	ESA Conference Proceedings
Volume	212
ISSN	1022-6656

Conference

Conference	3rd ESA Workshop On Millimetre Wave Technology and Applications
Country/Territory	Finland
City	Espoo
Period	21/05/03 → 23/05/03

Keywords

noise parameter measurements
on-wafer characterization
wide-band measurements

Cite this

Kantanen, Mikko ; Vähä-Heikkilä, Tauno ; Lahdes, Manu et al. / Transistor noise characterisation at 50-94 GHz. Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications: Circuits, systems, and measurement techniques. editor / J. Mallat ; A. Räisänen ; J. Tuovinen. European Space Agency (ESA), 2003. pp. 529-533 (ESA Conference Proceedings, Vol. 212).

@inproceedings{7a4f74ad3a754200920202fa11b034be,

title = "Transistor noise characterisation at 50-94 GHz",

keywords = "noise parameter measurements, on-wafer characterization, wide-band measurements",

author = "Mikko Kantanen and Tauno V{\"a}h{\"a}-Heikkil{\"a} and Manu Lahdes and Jussi Tuovinen",

year = "2003",

language = "English",

series = "ESA Conference Proceedings",

publisher = "European Space Agency (ESA)",

pages = "529--533",

editor = "J. Mallat and A. R{\"a}is{\"a}nen and J. Tuovinen",

booktitle = "Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications",

address = "France",

note = "3rd ESA Workshop On Millimetre Wave Technology and Applications : Circuits, systems and measurement techniques ; Conference date: 21-05-2003 Through 23-05-2003",

}

Kantanen, M , Vähä-Heikkilä, T , Lahdes, M & Tuovinen, J 2003, Transistor noise characterisation at 50-94 GHz. in J Mallat, A Räisänen & J Tuovinen (eds), Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications: Circuits, systems, and measurement techniques. European Space Agency (ESA), ESA Conference Proceedings, vol. 212, pp. 529-533, 3rd ESA Workshop On Millimetre Wave Technology and Applications, Espoo, Finland, 21/05/03.

Transistor noise characterisation at 50-94 GHz. / Kantanen, Mikko ; Vähä-Heikkilä, Tauno ; Lahdes, Manu et al.
Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications: Circuits, systems, and measurement techniques. ed. / J. Mallat; A. Räisänen; J. Tuovinen. European Space Agency (ESA), 2003. p. 529-533 (ESA Conference Proceedings, Vol. 212).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Transistor noise characterisation at 50-94 GHz

AU - Kantanen, Mikko

AU - Vähä-Heikkilä, Tauno

AU - Lahdes, Manu

AU - Tuovinen, Jussi

PY - 2003

Y1 - 2003

KW - noise parameter measurements

KW - on-wafer characterization

KW - wide-band measurements

M3 - Conference article in proceedings

T3 - ESA Conference Proceedings

SP - 529

EP - 533

BT - Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications

A2 - Mallat, J.

A2 - Räisänen, A.

A2 - Tuovinen, J.

PB - European Space Agency (ESA)

T2 - 3rd ESA Workshop On Millimetre Wave Technology and Applications

Y2 - 21 May 2003 through 23 May 2003

ER -