Transistor noise characterisation at 50-94 GHz

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications
Subtitle of host publicationCircuits, systems, and measurement techniques
EditorsJ. Mallat, A. Räisänen, J. Tuovinen
PublisherEuropean Space Agency ESA
Pages529-533
Publication statusPublished - 2003
MoE publication typeA4 Article in a conference publication
Event3rd ESA Workshop On Millimetre Wave Technology and Applications: Circuits, systems and measurement techniques - MilliLab, Espoo, Finland
Duration: 21 May 200323 May 2003

Publication series

SeriesESA Conference Proceedings
Volume212
ISSN1022-6656

Conference

Conference3rd ESA Workshop On Millimetre Wave Technology and Applications
CountryFinland
CityEspoo
Period21/05/0323/05/03

Keywords

  • noise parameter measurements
  • on-wafer characterization
  • wide-band measurements

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