@inproceedings{7a4f74ad3a754200920202fa11b034be,
title = "Transistor noise characterisation at 50-94 GHz",
keywords = "noise parameter measurements, on-wafer characterization, wide-band measurements",
author = "Mikko Kantanen and Tauno V{\"a}h{\"a}-Heikkil{\"a} and Manu Lahdes and Jussi Tuovinen",
year = "2003",
language = "English",
series = "ESA Conference Proceedings",
publisher = "European Space Agency (ESA)",
pages = "529--533",
editor = "J. Mallat and A. R{\"a}is{\"a}nen and J. Tuovinen",
booktitle = "Proceedings of 3rd ESA Workshop on Millimetre Wave Technology and Applications",
address = "France",
note = "3rd ESA Workshop On Millimetre Wave Technology and Applications : Circuits, systems and measurement techniques ; Conference date: 21-05-2003 Through 23-05-2003",
}