Abstract
A new analytical transit-time model for
submicrometer MOS devices has been developed. The model is based on a
modified SPICE level-three MOSFET DC model, and it allows the use of a
physical value for the charge carrier saturation velocity. This is
essential for accurate transit-time modeling. Both DC and transit-time
models show good agreement with the results obtained from more
complicated two-dimensional numerical simulations.
| Original language | English |
|---|---|
| Pages (from-to) | 830-832 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 40 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1993 |
| MoE publication type | A1 Journal article-refereed |
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