Transport Behavior of Commercially Available 100-Ω Standard Resistors
- B. Schumacher
- , P. Warnecke
- , W. Poirier
- , I. Delgado
- , Z. Msimang
- , G. Boella
- , P.O. Hetland
- , R.E. Elmquist
- , J. Williams
- , D. Inglis
- , B. Jeckelmann
- , O. Gunnarsson
- , A. Satrapinsky
- German National Metrology Institute (PTB)
- LCIE Bureau Véritas
- Centro Español de Metrología (CEM)
- National Metrology Laboratory, South Africa (NML)
- Istituto Elettrotecnico Nazionale Galileo Ferraris
- Norwegian Metrology Service
- National Institute for Standards and Technology
- National Physics Laboratory (NPL)
- National Research Council Canada (NRC)
- Federal Institute of Metrology (METAS)
- RISE Research Institutes of Sweden
- Centre for Metrology and Accreditation Finland (MIKES)
- VTT (former employee or external)
Research output: Contribution to journal › Article › Scientific › peer-review
7
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Citations
(Scopus)