Abstract
The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.
| Original language | English |
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| Pages (from-to) | 9757-9760 |
| Number of pages | 4 |
| Journal | Chemical Communications |
| Volume | 54 |
| Issue number | 70 |
| DOIs | |
| Publication status | Published - 28 Aug 2018 |
| MoE publication type | A1 Journal article-refereed |