Trends in the valence band electronic structures of mixed uranium oxides

Kristina O. Kvashnina; Piotr M. Kowalski; Sergei M. Butorin; Gregory Leinders; Janne Pakarinen; René Bès; Haijian Li; Marc Verwerft

doi:10.1039/c8cc05464a

Trends in the valence band electronic structures of mixed uranium oxides

Kristina O. Kvashnina^*
, Piotr M. Kowalski
, Sergei M. Butorin
, Gregory Leinders
, Janne Pakarinen
, René Bès
, Haijian Li
, Marc Verwerft

^*Corresponding author for this work

Not published at VTT

European Synchrotron Radiation Facility ESRF
Helmholtz Centre Dresden-Rossendorf (HZDR)
Forschungszentrum Jülich GmbH (FZJ)
Jülich Aachen Research Alliance (JARA)
Uppsala University
Belgian Nuclear Research Centre (SCK CEN)
Aalto University

Research output: Contribution to journal › Article › Scientific › peer-review

36 Citations (Scopus)

Abstract

The valence band electronic structures of mixed uranium oxides (UO₂, U₄O₉, U₃O₇, U₃O₈, and β-UO₃) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M₅ edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Original language	English
Pages (from-to)	9757-9760
Number of pages	4
Journal	Chemical Communications
Volume	54
Issue number	70
DOIs	https://doi.org/10.1039/c8cc05464a
Publication status	Published - 28 Aug 2018
MoE publication type	A1 Journal article-refereed

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abstract = "The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.",

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AU - Kvashnina, Kristina O.

AU - Kowalski, Piotr M.

AU - Butorin, Sergei M.

AU - Leinders, Gregory

AU - Pakarinen, Janne

AU - Bès, René

AU - Li, Haijian

AU - Verwerft, Marc

PY - 2018/8/28

Y1 - 2018/8/28

N2 - The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

AB - The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

UR - https://www.scopus.com/pages/publications/85052708132

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DO - 10.1039/c8cc05464a

M3 - Article

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VL - 54

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EP - 9760

JO - Chemical Communications

JF - Chemical Communications

IS - 70

ER -

Trends in the valence band electronic structures of mixed uranium oxides

Abstract

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