Abstract
Amorphous surface oxides of III–V semiconductors are harmful in many contexts of device development. Using low-energy electron diffraction and photoelectron spectroscopy, we demonstrate that surface oxides formed at Sn-capped GaAs(100) and InAs(100) surfaces in air are effectively removed by heating. This Sn-mediated oxide desorption procedure results in the initial well-defined Sn-stabilized (1×2) surface even for samples exposed to air for a prolonged time. Based on ab initio calculations we propose that the phenomenon is due to indirect and direct effects of Sn. The Sn-induced surface composition weakens oxygen adsorption.
| Original language | English |
|---|---|
| Article number | 231908 |
| Journal | Applied Physics Letters |
| Volume | 98 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 2011 |
| MoE publication type | A1 Journal article-refereed |
Keywords
- ab initio calculations
- adsorption
- amorphous state
- catalysts
- desorption
- heat treatment
- low energy electron diffraction
- metallic thin films
- photoelectron spectra
- surface composition
- tin
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