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Ultrathin (1*2)-Sn layer on GaAs(100) and InAs(100) substrates: A catalyst for removal of amorphous surface oxides

  • Pekka Laukkanen*
  • , Marko P.J. Punkkinen
  • , Jouko Lång
  • , Marjukka Tuominen
  • , Mikhail Kuzmin
  • , Veikko Tuominen
  • , Johnny Dahl
  • , Johan Adell
  • , Janusz Sadowski
  • , Janusz Kanski
  • , Ville Polojärvi
  • , Janne Pakarinen
  • , Kalevi Kokko
  • , Mircea Guina
  • , Markus Pessa
  • , Juhani Väyrynen
  • *Corresponding author for this work
  • University of Turku
  • Tampere University of Technology (TUT)
  • KTH Royal Institute of Technology
  • Ioffe Institute
  • Lund University
  • Polish Academy of Sciences
  • Chalmers University of Technology

Research output: Contribution to journalArticleScientificpeer-review

Abstract

Amorphous surface oxides of III–V semiconductors are harmful in many contexts of device development. Using low-energy electron diffraction and photoelectron spectroscopy, we demonstrate that surface oxides formed at Sn-capped GaAs(100) and InAs(100) surfaces in air are effectively removed by heating. This Sn-mediated oxide desorption procedure results in the initial well-defined Sn-stabilized (1×2) surface even for samples exposed to air for a prolonged time. Based on ab initio calculations we propose that the phenomenon is due to indirect and direct effects of Sn. The Sn-induced surface composition weakens oxygen adsorption.
Original languageEnglish
Article number231908
JournalApplied Physics Letters
Volume98
Issue number23
DOIs
Publication statusPublished - 2011
MoE publication typeA1 Journal article-refereed

Keywords

  • ab initio calculations
  • adsorption
  • amorphous state
  • catalysts
  • desorption
  • heat treatment
  • low energy electron diffraction
  • metallic thin films
  • photoelectron spectra
  • surface composition
  • tin

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