Unambiguous atomic structural determination of single-walled carbon nanotubes by electron diffraction

Hua Jiang (Corresponding Author), Albert G. Nasibulin, David P. Brown, Esko I. Kauppinen (Corresponding Author)

Research output: Contribution to journalArticleScientificpeer-review

62 Citations (Scopus)

Abstract

We introduce a novel non-dimensional “intrinsic layer-line spacing” concept for electron diffraction analysis of single-walled carbon nanotubes (SWCNTs). Accordingly, we develop a unique method for direct determination of chiral indices (n, m) of the carbon nanotubes from their electron diffraction patterns (EDPs). The new method is totally calibration-free. Errors due to the nanotube inclination are specified. The tilt angle of the carbon nanotube with respect to the incident electron beam is simultaneously evaluated, thus the effect of the tube tilting is compensated for in the (n, m) determination. Several effective procedures are proposed to cross-check the results by using abundant information contained in the diffraction patterns. The efficiency of the method is demonstrated on both simulated and experimental diffraction patterns from single-walled nanotubes. The technique can be extended to structural analysis of nanotubes of structure similar to carbon nanotubes, such as boron nitride nanotubes.
Original languageEnglish
Pages (from-to)662-667
JournalCarbon
Volume45
Issue number3
DOIs
Publication statusPublished - 2007
MoE publication typeA1 Journal article-refereed

Fingerprint

Single-walled carbon nanotubes (SWCN)
Electron diffraction
Nanotubes
Carbon Nanotubes
Diffraction patterns
Carbon nanotubes
Boron nitride
Structural analysis
Electron beams
Calibration

Keywords

  • carbon nanotubes
  • CNT
  • SWCNT
  • single-walled carbon nanotubes
  • electron diffraction analysis
  • structural analysis

Cite this

Jiang, Hua ; Nasibulin, Albert G. ; Brown, David P. ; Kauppinen, Esko I. / Unambiguous atomic structural determination of single-walled carbon nanotubes by electron diffraction. In: Carbon. 2007 ; Vol. 45, No. 3. pp. 662-667.
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abstract = "We introduce a novel non-dimensional “intrinsic layer-line spacing” concept for electron diffraction analysis of single-walled carbon nanotubes (SWCNTs). Accordingly, we develop a unique method for direct determination of chiral indices (n, m) of the carbon nanotubes from their electron diffraction patterns (EDPs). The new method is totally calibration-free. Errors due to the nanotube inclination are specified. The tilt angle of the carbon nanotube with respect to the incident electron beam is simultaneously evaluated, thus the effect of the tube tilting is compensated for in the (n, m) determination. Several effective procedures are proposed to cross-check the results by using abundant information contained in the diffraction patterns. The efficiency of the method is demonstrated on both simulated and experimental diffraction patterns from single-walled nanotubes. The technique can be extended to structural analysis of nanotubes of structure similar to carbon nanotubes, such as boron nitride nanotubes.",
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Unambiguous atomic structural determination of single-walled carbon nanotubes by electron diffraction. / Jiang, Hua (Corresponding Author); Nasibulin, Albert G.; Brown, David P.; Kauppinen, Esko I. (Corresponding Author).

In: Carbon, Vol. 45, No. 3, 2007, p. 662-667.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Unambiguous atomic structural determination of single-walled carbon nanotubes by electron diffraction

AU - Jiang, Hua

AU - Nasibulin, Albert G.

AU - Brown, David P.

AU - Kauppinen, Esko I.

PY - 2007

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N2 - We introduce a novel non-dimensional “intrinsic layer-line spacing” concept for electron diffraction analysis of single-walled carbon nanotubes (SWCNTs). Accordingly, we develop a unique method for direct determination of chiral indices (n, m) of the carbon nanotubes from their electron diffraction patterns (EDPs). The new method is totally calibration-free. Errors due to the nanotube inclination are specified. The tilt angle of the carbon nanotube with respect to the incident electron beam is simultaneously evaluated, thus the effect of the tube tilting is compensated for in the (n, m) determination. Several effective procedures are proposed to cross-check the results by using abundant information contained in the diffraction patterns. The efficiency of the method is demonstrated on both simulated and experimental diffraction patterns from single-walled nanotubes. The technique can be extended to structural analysis of nanotubes of structure similar to carbon nanotubes, such as boron nitride nanotubes.

AB - We introduce a novel non-dimensional “intrinsic layer-line spacing” concept for electron diffraction analysis of single-walled carbon nanotubes (SWCNTs). Accordingly, we develop a unique method for direct determination of chiral indices (n, m) of the carbon nanotubes from their electron diffraction patterns (EDPs). The new method is totally calibration-free. Errors due to the nanotube inclination are specified. The tilt angle of the carbon nanotube with respect to the incident electron beam is simultaneously evaluated, thus the effect of the tube tilting is compensated for in the (n, m) determination. Several effective procedures are proposed to cross-check the results by using abundant information contained in the diffraction patterns. The efficiency of the method is demonstrated on both simulated and experimental diffraction patterns from single-walled nanotubes. The technique can be extended to structural analysis of nanotubes of structure similar to carbon nanotubes, such as boron nitride nanotubes.

KW - carbon nanotubes

KW - CNT

KW - SWCNT

KW - single-walled carbon nanotubes

KW - electron diffraction analysis

KW - structural analysis

U2 - 10.1016/j.carbon.2006.07.025

DO - 10.1016/j.carbon.2006.07.025

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