Abstract
We introduce a novel non-dimensional “intrinsic layer-line spacing”
concept for electron diffraction analysis of single-walled carbon nanotubes
(SWCNTs). Accordingly, we develop a unique method for direct determination of
chiral indices (n, m) of the carbon nanotubes from their electron diffraction
patterns (EDPs). The new method is totally calibration-free. Errors due to the
nanotube inclination are specified. The tilt angle of the carbon nanotube
with respect to the incident electron beam is simultaneously evaluated, thus
the effect of the tube tilting is compensated for in the (n, m) determination.
Several effective procedures are proposed to cross-check the results by using
abundant information contained in the diffraction patterns. The efficiency of
the method is demonstrated on both simulated and experimental diffraction
patterns from single-walled nanotubes. The technique can be extended to
structural analysis of nanotubes of structure similar to carbon nanotubes,
such as boron nitride nanotubes.
Original language | English |
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Pages (from-to) | 662-667 |
Journal | Carbon |
Volume | 45 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2007 |
MoE publication type | A1 Journal article-refereed |
Keywords
- carbon nanotubes
- CNT
- SWCNT
- single-walled carbon nanotubes
- electron diffraction analysis
- structural analysis