Uncertainty analysis of photometer directional response index f2 using Monte Carlo simulation

Tuomas Poikonen, Peter Blattner, Petri Kärhä, Erkki Ikonen

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)

Abstract

The uncertainty of the photometer directional response index f2 is investigated using Monte Carlo simulations and error models derived for the characterization measurements of three photometers. Both random and biased types of errors are used simultaneously to model the measurement noise, drift of the light source, alignment of the photometer, and the errors of the rotary stage. The values of f2 obtained for each azimuth angle of the photometer are sensitive to the asymmetry of the directional response. It is shown by variation of the photometer symmetry that the changes in the value of f2 calculated as an average of all simulated values are small. It is further demonstrated that with typical measurement distances the quality index f2 can be sensitive to the position of the axis of rotation with respect to the receiving plane of the photometer. The simulated f2 values of the three photometers with expanded uncertainties (k = 2) are (4.325 ± 0.035)%, (1.698 ± 0.027)% and (4.315 ± 0.030)%.
Original languageEnglish
Pages (from-to)727-736
Number of pages9
JournalMetrologia
Volume49
Issue number6
DOIs
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

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