Fingerprint
Dive into the research topics of 'Use of a TiN barrier to improve GaAs FET ohmic contact reliability'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Use of a TiN barrier to improve GaAs FET ohmic contact reliability
Ronald Remba, Ilkka Suni, Marc Nicolet
Research output: Contribution to journal › Article › Scientific › peer-review
12
Citations
(Scopus)