Abstract
An electron cooling junction using platinum silicide as a
superconductor contact is demonstrated for the first
time. The junction shows encouraging electrical
characteristics and a fit to a standard cooling model
predicts cooling from 100 mK to 50 mK for a test device.
Silicides have been widely used in the semiconductor
industry because of their reliability and reduced contact
resistance; hence this technology could find wider
application in a silicon-based electron refrigerator.
Original language | English |
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Title of host publication | 14th International Conference on Ultimate Integration on Silicon, ULIS 2013 |
Publisher | IEEE Institute of Electrical and Electronic Engineers |
Pages | 201-204 |
ISBN (Electronic) | 978-1-4673-4802-7, 978-1-4673-4801-0 |
ISBN (Print) | 978-1-4673-4800-3 |
DOIs | |
Publication status | Published - 2013 |
MoE publication type | A4 Article in a conference publication |
Event | 14th International Conference on Ultimate Integration on Silicon, ULIS 2013 - Coventry, United Kingdom Duration: 19 Mar 2013 → 21 Mar 2013 Conference number: 14 |
Conference
Conference | 14th International Conference on Ultimate Integration on Silicon, ULIS 2013 |
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Abbreviated title | ULIS 2013 |
Country/Territory | United Kingdom |
City | Coventry |
Period | 19/03/13 → 21/03/13 |
Keywords
- cooling
- electron
- millikelvin
- platinum
- silicide
- superconductor