Using reverse-engineered test-based models to generate more tests: Where is the sense in that?

Teemu Kanstrén, Eric Piel, Hans-Gerhard Gross

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

Abstract

Model-based testing is a process of generating tests for a test target based on a behavioral model. In many cases, suitable models do not exist and building these from scratch is a costly effort. A potential approach to bootstrap this process is to generate models with reverse-engineering methods. Potential sources of information for such models include user sessions, existing test cases, and field data. All of these can be seen as different forms of test data. However, using existing test cases as a basis to create a model for test generation raises the question of what is the benefit over the previously existing tests. This paper aims to answer this question by evaluating the benefits in terms of a practical case study.
Original languageEnglish
Title of host publicationProceedings of the 9th International Conference on Information Technology. New Generations, ITNG 2012
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages247-252
ISBN (Print)978-1-4673-0798-7, 978-0-7695-4654-4
DOIs
Publication statusPublished - 2012
MoE publication typeNot Eligible
Event9th International Conference on Information Technology. New Generations. ITNG 2012, Las Vegas, 16-18 Apr. 2012 - Las Vegas, NV, United States
Duration: 16 Apr 201218 Apr 2012

Conference

Conference9th International Conference on Information Technology. New Generations. ITNG 2012, Las Vegas, 16-18 Apr. 2012
Abbreviated titleITNG 2012
CountryUnited States
CityLas Vegas, NV
Period16/04/1218/04/12

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Keywords

  • model-based testing
  • observation-based modelling
  • test automation
  • specification mining

Cite this

Kanstrén, T., Piel, E., & Gross, H-G. (2012). Using reverse-engineered test-based models to generate more tests: Where is the sense in that? In Proceedings of the 9th International Conference on Information Technology. New Generations, ITNG 2012 (pp. 247-252). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/ITNG.2012.42