UTD-Based Path Loss Prediction with Experimental Validations for Micro-Cellular Mobile Radio Communications

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Abstract

The new work makes three UTD (uniforn geometrical theory of diffraction) based path-loss prediction models and their experimental validations for urban micro-cellular mobile radio communications. The three models apply to the base station and mobile antennas much lower than the surrounding buildings and can be written in explicit forms for both vertical-and horizontal-polarization transmission and reception. Comparisons of their predictions with measurements at 900.5 and 1800 MHz in shadow zones of urban areas confirm the three models experimentally. The results demonstrate that fast two-dimensional (2-D) models which do not require a building height database can provide acceptable accuracy for micro-cellular mobile radio propagation predictions in urban environments. The methodology of this work is to deternine in advance significant rays to use, from a particular geometry of the buildings in an urban area. It appears suitable here for 2-D modeling for parallel-street problem and irregular side-street problems. It has the potential to be used in practical design of micro-cellular mobile radio systems.

Original languageEnglish
Title of host publication27th European Microwave Conference
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages232-237
Number of pages6
DOIs
Publication statusPublished - 1 Jan 1997
MoE publication typeA4 Article in a conference publication
Event1997 27th European Microwave Conference, EuMC 1997 - Jerusalem, Israel
Duration: 8 Sep 199712 Sep 1997

Conference

Conference1997 27th European Microwave Conference, EuMC 1997
CountryIsrael
CityJerusalem
Period8/09/9712/09/97

Keywords

  • 2-D UTD propagation model
  • Micro-cellular mobile radio
  • Multiple diffraction
  • Reflection

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    Zhang, W., & Lahteenmaki, J. (1997). UTD-Based Path Loss Prediction with Experimental Validations for Micro-Cellular Mobile Radio Communications. In 27th European Microwave Conference (pp. 232-237). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/EUMA.1997.337803