V-band on-wafer noise parameter measurements

Manu Lahdes, Jussi Tuovinen

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientific

    6 Citations (Scopus)
    Original languageEnglish
    Title of host publicationGAAS 98 Conference Proceedings
    PublisherMicrowave Engineering Europe
    Pages39-44
    ISBN (Print)978-0-86213-146-3
    Publication statusPublished - 1998
    MoE publication typeB3 Non-refereed article in conference proceedings
    EventEuropean Gallium Arsenide and Related III-V Compounds Application Symposium, GAAS '98: Held jointly with the 28th European Microwave Conference, EuMC 1998 - Amsterdam, Netherlands
    Duration: 6 Oct 19988 Oct 1998

    Conference

    ConferenceEuropean Gallium Arsenide and Related III-V Compounds Application Symposium, GAAS '98
    CountryNetherlands
    CityAmsterdam
    Period6/10/988/10/98

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