Vacancy defects in epitaxial InN: Identification and electrical properties

A. Laakso, J. Oila, A. Kemppinen, K. Saarinen*, W. Egger, L. Liszkay, P. Sperr, H. Lu, W. J. Schaff

*Corresponding author for this work

Research output: Contribution to journalArticle in a proceedings journalScientificpeer-review

18 Citations (Scopus)

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