VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle

Juho Perälä (Editor), Amirhossein Alimohammad (Editor), Andrea Baruzzo (Editor), Lydie du Bousquet (Editor), Petre Dini (Editor), Henry Muccini (Editor), Alexander Klaus (Editor), Davide Pandini (Editor), Raj Senguttuvan (Editor), Avik Sinha (Editor), Alin Stefanescu (Editor), Bart Vermeulen (Editor), Stefan van Baelen (Editor), Hans-Gerhard Gross (Editor)

Research output: Book/ReportBook (editor)

Original languageEnglish
PublisherIEEE Institute of Electrical and Electronic Engineers
ISBN (Print)978-1-4244-7784-5, 978-0-7695-4146-4
Publication statusPublished - 2010
MoE publication typeC2 Edited books
Event2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France
Duration: 22 Aug 201027 Aug 2010
Conference number: 2

Cite this

Perälä, J., Alimohammad, A., Baruzzo, A., du Bousquet, L., Dini, P., Muccini, H., ... Gross, H-G. (Eds.) (2010). VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers .
Perälä, Juho (Editor) ; Alimohammad, Amirhossein (Editor) ; Baruzzo, Andrea (Editor) ; du Bousquet, Lydie (Editor) ; Dini, Petre (Editor) ; Muccini, Henry (Editor) ; Klaus, Alexander (Editor) ; Pandini, Davide (Editor) ; Senguttuvan, Raj (Editor) ; Sinha, Avik (Editor) ; Stefanescu, Alin (Editor) ; Vermeulen, Bart (Editor) ; van Baelen, Stefan (Editor) ; Gross, Hans-Gerhard (Editor). / VALID 2010 : Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers , 2010.
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title = "VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle",
editor = "Juho Per{\"a}l{\"a} and Amirhossein Alimohammad and Andrea Baruzzo and {du Bousquet}, Lydie and Petre Dini and Henry Muccini and Alexander Klaus and Davide Pandini and Raj Senguttuvan and Avik Sinha and Alin Stefanescu and Bart Vermeulen and {van Baelen}, Stefan and Hans-Gerhard Gross",
year = "2010",
language = "English",
isbn = "978-1-4244-7784-5",
publisher = "IEEE Institute of Electrical and Electronic Engineers",
address = "United States",

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Perälä, J, Alimohammad, A, Baruzzo, A, du Bousquet, L, Dini, P, Muccini, H, Klaus, A, Pandini, D, Senguttuvan, R, Sinha, A, Stefanescu, A, Vermeulen, B, van Baelen, S & Gross, H-G (eds) 2010, VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers .

VALID 2010 : Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. / Perälä, Juho (Editor); Alimohammad, Amirhossein (Editor); Baruzzo, Andrea (Editor); du Bousquet, Lydie (Editor); Dini, Petre (Editor); Muccini, Henry (Editor); Klaus, Alexander (Editor); Pandini, Davide (Editor); Senguttuvan, Raj (Editor); Sinha, Avik (Editor); Stefanescu, Alin (Editor); Vermeulen, Bart (Editor); van Baelen, Stefan (Editor); Gross, Hans-Gerhard (Editor).

IEEE Institute of Electrical and Electronic Engineers , 2010.

Research output: Book/ReportBook (editor)

TY - BOOK

T1 - VALID 2010

T2 - Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle

A2 - Perälä, Juho

A2 - Alimohammad, Amirhossein

A2 - Baruzzo, Andrea

A2 - du Bousquet, Lydie

A2 - Dini, Petre

A2 - Muccini, Henry

A2 - Klaus, Alexander

A2 - Pandini, Davide

A2 - Senguttuvan, Raj

A2 - Sinha, Avik

A2 - Stefanescu, Alin

A2 - Vermeulen, Bart

A2 - van Baelen, Stefan

A2 - Gross, Hans-Gerhard

PY - 2010

Y1 - 2010

M3 - Book (editor)

SN - 978-1-4244-7784-5

SN - 978-0-7695-4146-4

BT - VALID 2010

PB - IEEE Institute of Electrical and Electronic Engineers

ER -

Perälä J, (ed.), Alimohammad A, (ed.), Baruzzo A, (ed.), du Bousquet L, (ed.), Dini P, (ed.), Muccini H, (ed.) et al. VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers , 2010.