VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle

Juho Perälä (Editor), Amirhossein Alimohammad (Editor), Andrea Baruzzo (Editor), Lydie du Bousquet (Editor), Petre Dini (Editor), Henry Muccini (Editor), Alexander Klaus (Editor), Davide Pandini (Editor), Raj Senguttuvan (Editor), Avik Sinha (Editor), Alin Stefanescu (Editor), Bart Vermeulen (Editor), Stefan van Baelen (Editor), Hans-Gerhard Gross (Editor)

Research output: Book/ReportBook (editor)

Original languageEnglish
PublisherIEEE Institute of Electrical and Electronic Engineers
ISBN (Print)978-1-4244-7784-5, 978-0-7695-4146-4
Publication statusPublished - 2010
MoE publication typeC2 Edited books
Event2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France
Duration: 22 Aug 201027 Aug 2010
Conference number: 2

Cite this

Perälä, J., Alimohammad, A., Baruzzo, A., du Bousquet, L., Dini, P., Muccini, H., Klaus, A., Pandini, D., Senguttuvan, R., Sinha, A., Stefanescu, A., Vermeulen, B., van Baelen, S., & Gross, H-G. (Eds.) (2010). VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers. https://ieeexplore.ieee.org/servlet/opac?punumber=5613990