VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle

Juho Perälä; Amirhossein Alimohammad; Andrea Baruzzo; Lydie du Bousquet; Petre Dini; Henry Muccini; Alexander Klaus; Davide Pandini; Raj Senguttuvan; Avik Sinha; Alin Stefanescu; Bart Vermeulen; Stefan van Baelen; Hans-Gerhard Gross

VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle

Juho Perälä (Editor)
, Amirhossein Alimohammad (Editor)
, Andrea Baruzzo (Editor)
, Lydie du Bousquet (Editor)
, Petre Dini (Editor)
, Henry Muccini (Editor)
, Alexander Klaus (Editor)
, Davide Pandini (Editor)
, Raj Senguttuvan (Editor)
, Avik Sinha (Editor)
, Alin Stefanescu (Editor)
, Bart Vermeulen (Editor)
, Stefan van Baelen (Editor)
, Hans-Gerhard Gross (Editor)

VTT Technical Research Centre of Finland

Ukalta Engineering
University of Udine
Grenoble Computer Science Laboratory
Concordia University (Montreal)
Fraunhofer Institute for Experimental Software Engineering (IESE)
University of L'Aquila
STMicroelectronics S.r.l.
Texas Instruments
IBM (United States)
SAP Research
NXP Semiconductors Netherlands B.V.
Katholieke Universiteit Leuven (KU Leuven)
Delft University of Technology

Research output: Book/Report › Book (editor) › Scientific › peer-review

Original language	English
Publisher	IEEE Institute of Electrical and Electronic Engineers
ISBN (Print)	978-1-4244-7784-5, 978-0-7695-4146-4
Publication status	Published - 2010
MoE publication type	C2 Edited books
Event	2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010 - Nice, France Duration: 22 Aug 2010 → 27 Aug 2010 Conference number: 2

Access to Document

https://ieeexplore.ieee.org/servlet/opac?punumber=5613990

Cite this

Perälä, J., Alimohammad, A., Baruzzo, A., du Bousquet, L., Dini, P., Muccini, H., Klaus, A., Pandini, D., Senguttuvan, R., Sinha, A., Stefanescu, A., Vermeulen, B., van Baelen, S., & Gross, H.-G. (Eds.) (2010). VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers. https://ieeexplore.ieee.org/servlet/opac?punumber=5613990

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title = "VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle",

editor = "Juho Per{\"a}l{\"a} and Amirhossein Alimohammad and Andrea Baruzzo and \{du Bousquet\}, Lydie and Petre Dini and Henry Muccini and Alexander Klaus and Davide Pandini and Raj Senguttuvan and Avik Sinha and Alin Stefanescu and Bart Vermeulen and \{van Baelen\}, Stefan and Hans-Gerhard Gross",

year = "2010",

language = "English",

isbn = "978-1-4244-7784-5",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

address = "United States",

note = "2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010, VALID 2010 ; Conference date: 22-08-2010 Through 27-08-2010",

}

Perälä, J, Alimohammad, A, Baruzzo, A, du Bousquet, L, Dini, P, Muccini, H, Klaus, A, Pandini, D, Senguttuvan, R, Sinha, A, Stefanescu, A, Vermeulen, B, van Baelen, S & Gross, H-G (eds) 2010, VALID 2010: Proceedings of the Second International Conference on Advances in System Testing and Validation Lifecycle. IEEE Institute of Electrical and Electronic Engineers. <https://ieeexplore.ieee.org/servlet/opac?punumber=5613990>

TY - BOOK

T1 - VALID 2010

T2 - 2nd International Conference on Advances in System Testing and Validation Lifecycle, VALID 2010

A2 - Perälä, Juho

A2 - Alimohammad, Amirhossein

A2 - Baruzzo, Andrea

A2 - du Bousquet, Lydie

A2 - Dini, Petre

A2 - Muccini, Henry

A2 - Klaus, Alexander

A2 - Pandini, Davide

A2 - Senguttuvan, Raj

A2 - Sinha, Avik

A2 - Stefanescu, Alin

A2 - Vermeulen, Bart

A2 - van Baelen, Stefan

A2 - Gross, Hans-Gerhard

N1 - Conference code: 2

PY - 2010

Y1 - 2010

M3 - Book (editor)

SN - 978-1-4244-7784-5

SN - 978-0-7695-4146-4

BT - VALID 2010

PB - IEEE Institute of Electrical and Electronic Engineers

Y2 - 22 August 2010 through 27 August 2010

ER -