Validation of Model-Based Testing in Hardware in the Loop Platform

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publication10th International Conference on Information Technology
Subtitle of host publicationNew Generations
PublisherIEEE Institute of Electrical and Electronic Engineers
Pages331-336
Number of pages6
ISBN (Electronic)978-0-7695-4967-5
ISBN (Print)978-0-7695-4967-5
DOIs
Publication statusPublished - 30 Sep 2013
MoE publication typeNot Eligible
Event10th International Conference on Information Technology: New Generations, ITNG 2013 - Las Vegas, NV, United States
Duration: 15 Apr 201317 Apr 2013

Conference

Conference10th International Conference on Information Technology: New Generations, ITNG 2013
Abbreviated titleITNG 2013
CountryUnited States
CityLas Vegas, NV
Period15/04/1317/04/13

Keywords

  • digital simulation
  • embedded systems
  • program testing
  • program verification
  • model-based testing validation approach
  • hardware in the loop simulation platform
  • testing environment
  • test design automation
  • MBT
  • embedded system under testing
  • SUT
  • many-sided process view
  • system level testing activity
  • HIL prototype platform
  • software testing
  • testing
  • hardware
  • adaptation models
  • software algorithms
  • vectors
  • software packages
  • testing system validation
  • testing process
  • model-based testing
  • hardware in the loop

Cite this

Keränen, J., & Räty, T. (2013). Validation of Model-Based Testing in Hardware in the Loop Platform. In 10th International Conference on Information Technology: New Generations (pp. 331-336). IEEE Institute of Electrical and Electronic Engineers . https://doi.org/10.1109/ITNG.2013.53
Keränen, J. ; Räty, T. / Validation of Model-Based Testing in Hardware in the Loop Platform. 10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers , 2013. pp. 331-336
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title = "Validation of Model-Based Testing in Hardware in the Loop Platform",
keywords = "digital simulation, embedded systems, program testing, program verification, model-based testing validation approach, hardware in the loop simulation platform, testing environment, test design automation, MBT, embedded system under testing, SUT, many-sided process view, system level testing activity, HIL prototype platform, software testing, testing, hardware, adaptation models, software algorithms, vectors, software packages, testing system validation, testing process, model-based testing, hardware in the loop",
author = "J. Ker{\"a}nen and T. R{\"a}ty",
year = "2013",
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doi = "10.1109/ITNG.2013.53",
language = "English",
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booktitle = "10th International Conference on Information Technology",
publisher = "IEEE Institute of Electrical and Electronic Engineers",
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}

Keränen, J & Räty, T 2013, Validation of Model-Based Testing in Hardware in the Loop Platform. in 10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers , pp. 331-336, 10th International Conference on Information Technology: New Generations, ITNG 2013, Las Vegas, NV, United States, 15/04/13. https://doi.org/10.1109/ITNG.2013.53

Validation of Model-Based Testing in Hardware in the Loop Platform. / Keränen, J.; Räty, T.

10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers , 2013. p. 331-336.

Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

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AU - Räty, T.

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KW - embedded systems

KW - program testing

KW - program verification

KW - model-based testing validation approach

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KW - testing environment

KW - test design automation

KW - MBT

KW - embedded system under testing

KW - SUT

KW - many-sided process view

KW - system level testing activity

KW - HIL prototype platform

KW - software testing

KW - testing

KW - hardware

KW - adaptation models

KW - software algorithms

KW - vectors

KW - software packages

KW - testing system validation

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KW - model-based testing

KW - hardware in the loop

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M3 - Conference article in proceedings

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PB - IEEE Institute of Electrical and Electronic Engineers

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Keränen J, Räty T. Validation of Model-Based Testing in Hardware in the Loop Platform. In 10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers . 2013. p. 331-336 https://doi.org/10.1109/ITNG.2013.53