Validation of Model-Based Testing in Hardware in the Loop Platform

J. Keränen; T. Räty

doi:10.1109/ITNG.2013.53

Validation of Model-Based Testing in Hardware in the Loop Platform

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	10th International Conference on Information Technology
Subtitle of host publication	New Generations
Publisher	IEEE Institute of Electrical and Electronic Engineers
Pages	331-336
Number of pages	6
ISBN (Electronic)	978-0-7695-4967-5
ISBN (Print)	978-0-7695-4967-5
DOIs	https://doi.org/10.1109/ITNG.2013.53
Publication status	Published - 30 Sep 2013
MoE publication type	Not Eligible
Event	10th International Conference on Information Technology: New Generations, ITNG 2013 - Las Vegas, NV, United States Duration: 15 Apr 2013 → 17 Apr 2013

Conference

Conference	10th International Conference on Information Technology: New Generations, ITNG 2013
Abbreviated title	ITNG 2013
Country	United States
City	Las Vegas, NV
Period	15/04/13 → 17/04/13

Keywords

digital simulation
embedded systems
program testing
program verification
model-based testing validation approach
hardware in the loop simulation platform
testing environment
test design automation
MBT
embedded system under testing
SUT
many-sided process view
system level testing activity
HIL prototype platform
software testing
testing
hardware
adaptation models
software algorithms
vectors
software packages
testing system validation
testing process
model-based testing
hardware in the loop

Access to Document

10.1109/ITNG.2013.53

Cite this

Keränen, J., & Räty, T. (2013). Validation of Model-Based Testing in Hardware in the Loop Platform. In 10th International Conference on Information Technology: New Generations (pp. 331-336). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ITNG.2013.53

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title = "Validation of Model-Based Testing in Hardware in the Loop Platform",

keywords = "digital simulation, embedded systems, program testing, program verification, model-based testing validation approach, hardware in the loop simulation platform, testing environment, test design automation, MBT, embedded system under testing, SUT, many-sided process view, system level testing activity, HIL prototype platform, software testing, testing, hardware, adaptation models, software algorithms, vectors, software packages, testing system validation, testing process, model-based testing, hardware in the loop",

author = "J. Ker{\"a}nen and T. R{\"a}ty",

year = "2013",

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day = "30",

doi = "10.1109/ITNG.2013.53",

language = "English",

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booktitle = "10th International Conference on Information Technology",

publisher = "IEEE Institute of Electrical and Electronic Engineers",

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Keränen, J & Räty, T 2013, Validation of Model-Based Testing in Hardware in the Loop Platform. in 10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers, pp. 331-336, 10th International Conference on Information Technology: New Generations, ITNG 2013, Las Vegas, NV, United States, 15/04/13. https://doi.org/10.1109/ITNG.2013.53

Validation of Model-Based Testing in Hardware in the Loop Platform. / Keränen, J.; Räty, T.

10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers, 2013. p. 331-336.

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

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KW - program verification

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KW - test design automation

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KW - many-sided process view

KW - system level testing activity

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KW - software testing

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KW - adaptation models

KW - software algorithms

KW - vectors

KW - software packages

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KW - testing process

KW - model-based testing

KW - hardware in the loop

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