| Original language | English |
|---|---|
| Title of host publication | 10th International Conference on Information Technology |
| Subtitle of host publication | New Generations |
| Publisher | IEEE Institute of Electrical and Electronic Engineers |
| Pages | 331-336 |
| Number of pages | 6 |
| ISBN (Electronic) | 978-0-7695-4967-5 |
| ISBN (Print) | 978-0-7695-4967-5 |
| DOIs | |
| Publication status | Published - 30 Sep 2013 |
| MoE publication type | Not Eligible |
| Event | 10th International Conference on Information Technology: New Generations, ITNG 2013 - Las Vegas, NV, United States Duration: 15 Apr 2013 → 17 Apr 2013 |
Conference
| Conference | 10th International Conference on Information Technology: New Generations, ITNG 2013 |
|---|---|
| Abbreviated title | ITNG 2013 |
| Country | United States |
| City | Las Vegas, NV |
| Period | 15/04/13 → 17/04/13 |
Keywords
- digital simulation
- embedded systems
- program testing
- program verification
- model-based testing validation approach
- hardware in the loop simulation platform
- testing environment
- test design automation
- MBT
- embedded system under testing
- SUT
- many-sided process view
- system level testing activity
- HIL prototype platform
- software testing
- testing
- hardware
- adaptation models
- software algorithms
- vectors
- software packages
- testing system validation
- testing process
- model-based testing
- hardware in the loop
Cite this
}
Validation of Model-Based Testing in Hardware in the Loop Platform. / Keränen, J.; Räty, T.
10th International Conference on Information Technology: New Generations. IEEE Institute of Electrical and Electronic Engineers , 2013. p. 331-336.Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
TY - GEN
T1 - Validation of Model-Based Testing in Hardware in the Loop Platform
AU - Keränen, J.
AU - Räty, T.
PY - 2013/9/30
Y1 - 2013/9/30
KW - digital simulation
KW - embedded systems
KW - program testing
KW - program verification
KW - model-based testing validation approach
KW - hardware in the loop simulation platform
KW - testing environment
KW - test design automation
KW - MBT
KW - embedded system under testing
KW - SUT
KW - many-sided process view
KW - system level testing activity
KW - HIL prototype platform
KW - software testing
KW - testing
KW - hardware
KW - adaptation models
KW - software algorithms
KW - vectors
KW - software packages
KW - testing system validation
KW - testing process
KW - model-based testing
KW - hardware in the loop
U2 - 10.1109/ITNG.2013.53
DO - 10.1109/ITNG.2013.53
M3 - Conference article in proceedings
SN - 978-0-7695-4967-5
SP - 331
EP - 336
BT - 10th International Conference on Information Technology
PB - IEEE Institute of Electrical and Electronic Engineers
ER -