Validation of Model-Based Testing in Hardware in the Loop Platform

    Research output: Chapter in Book/Report/Conference proceedingConference article in proceedingsScientificpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publication10th International Conference on Information Technology
    Subtitle of host publicationNew Generations
    PublisherIEEE Institute of Electrical and Electronic Engineers
    Pages331-336
    Number of pages6
    ISBN (Electronic)978-0-7695-4967-5
    ISBN (Print)978-0-7695-4967-5
    DOIs
    Publication statusPublished - 30 Sep 2013
    MoE publication typeNot Eligible
    Event10th International Conference on Information Technology: New Generations, ITNG 2013 - Las Vegas, NV, United States
    Duration: 15 Apr 201317 Apr 2013

    Conference

    Conference10th International Conference on Information Technology: New Generations, ITNG 2013
    Abbreviated titleITNG 2013
    CountryUnited States
    CityLas Vegas, NV
    Period15/04/1317/04/13

    Keywords

    • digital simulation
    • embedded systems
    • program testing
    • program verification
    • model-based testing validation approach
    • hardware in the loop simulation platform
    • testing environment
    • test design automation
    • MBT
    • embedded system under testing
    • SUT
    • many-sided process view
    • system level testing activity
    • HIL prototype platform
    • software testing
    • testing
    • hardware
    • adaptation models
    • software algorithms
    • vectors
    • software packages
    • testing system validation
    • testing process
    • model-based testing
    • hardware in the loop

    Cite this

    Keränen, J., & Räty, T. (2013). Validation of Model-Based Testing in Hardware in the Loop Platform. In 10th International Conference on Information Technology: New Generations (pp. 331-336). IEEE Institute of Electrical and Electronic Engineers. https://doi.org/10.1109/ITNG.2013.53