Vapour phase decomposition graphite furnace atomic absorption spectroscopy (VPD-GFAAS) analysis of Na, Mg and Al on silicon wafer surfaces

Heini Saloniemi, Jouko Hintsala, Taru Visti, Simo Eränen

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsScientific

    Original languageEnglish
    Title of host publicationKemian Päivät - Finnish Chemical Congress and Exhibition 2000
    PublisherAssociation of Finnish Chemical Societies
    Publication statusPublished - 2000
    MoE publication typeNot Eligible
    EventKemian Päivät 2000 - Helsinki, Finland
    Duration: 15 Nov 200017 Nov 2000

    Conference

    ConferenceKemian Päivät 2000
    CountryFinland
    CityHelsinki
    Period15/11/0017/11/00

    Cite this

    Saloniemi, H., Hintsala, J., Visti, T., & Eränen, S. (2000). Vapour phase decomposition graphite furnace atomic absorption spectroscopy (VPD-GFAAS) analysis of Na, Mg and Al on silicon wafer surfaces. In Kemian Päivät - Finnish Chemical Congress and Exhibition 2000 [43] Association of Finnish Chemical Societies.